Identification of defective two dimensional semiconductors by multifractal analysis: The single-layer MoS 2 case study

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Bibliographic Details
Published inPhysica A Vol. 508; pp. 757 - 770
Main Authors Shidpour, Reza, Movahed, S.M.S.
Format Journal Article
LanguageEnglish
Published 01.10.2018
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ISSN:0378-4371
DOI:10.1016/j.physa.2018.05.078