320×256 Extended Wavelength In x Ga 1-x As/InP Focal Plane Arrays: Dislocation Defect, Dark Signal and Noise
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Published in | IEEE journal of selected topics in quantum electronics Vol. 28; no. 2: Optical Detectors; pp. 1 - 11 |
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Main Authors | , , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
01.03.2022
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Online Access | Get full text |
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ISSN: | 1077-260X 1558-4542 |
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DOI: | 10.1109/JSTQE.2021.3087182 |