Characterization of epitaxial CVD graphene on Ir(111)/α-Al 2 O 3 (0001) by photoelectron momentum microscopy

Abstract We characterized CVD-grown graphene with high single-crystallinity on Ir(111)/ α -Al 2 O 3 (0001) by photoelectron momentum microscopy. A multi-functional photoelectron momentum microscope (PMM), which is installed with element-specific valence band photoelectron spectroscopy and X-ray abso...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 61; no. SD; p. SD1015
Main Authors Hashimoto, Eri, Tamura, Keigo, Yamaguchi, Hayato, Watanabe, Takeshi, Matsui, Fumihiko, Koh, Shinji
Format Journal Article
LanguageEnglish
Published 01.06.2022
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Summary:Abstract We characterized CVD-grown graphene with high single-crystallinity on Ir(111)/ α -Al 2 O 3 (0001) by photoelectron momentum microscopy. A multi-functional photoelectron momentum microscope (PMM), which is installed with element-specific valence band photoelectron spectroscopy and X-ray absorption spectroscopy, is a complementary characterization tool to conventional methods, such as Raman spectroscopy and atomic force microscopy, for comprehensive and quantitative characterization of graphene/Ir(111). Using PMM, we characterized the properties of CVD-grown graphene including the single-crystallinity, number of layers, crystal orientation, and degree of interaction between graphene and Ir(111) and clarified the relationship between these properties and the CVD growth conditions.
ISSN:0021-4922
1347-4065
DOI:10.35848/1347-4065/ac4ad8