S/TEM Characterization of Vertical Heterostructures Formed by Mono- to Multi-layer Graphene and WSe 2

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 27; no. S1; pp. 894 - 895
Main Authors Bachu, Saiphaneendra, Huet, Benjamin, Hickey, Danielle Reifsnyder, Qian, Chenhao, Redwing, Joan, Alem, Nasim
Format Journal Article
LanguageEnglish
Published 01.08.2021
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927621003457