A 20F 2 /Bit Current-Integration-Based Differential nand-Structured PUF for Stable and V / T Variation-Tolerant Low-Cost IoT Security

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Bibliographic Details
Published inIEEE journal of solid-state circuits Vol. 57; no. 10; pp. 2957 - 2968
Main Authors Lee, Jongmin, Kim, Minsun, Jeong, Minhyeok, Shin, Gicheol, Lee, Yoonmyung
Format Journal Article
LanguageEnglish
Published 01.10.2022
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ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.2022.3192903