Back Cover: Light‐Induced Dynamic Activation of Copper/Silicon Interface for Highly Selective Carbon Dioxide Reduction (Angew. Chem. Int. Ed. 33/2024)

Light‐induced dynamic metal nanocrystal/semiconductor interfaces during carbon dioxide electroreduction were investigated by utilizing synchrotron radiation X‐ray absorption spectroscopy, as reported by Hao Ming Chen et al. in their Research Article (e202403333). The dynamic structural transformatio...

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Published inAngewandte Chemie International Edition Vol. 63; no. 33
Main Authors Wang, Jiali, Lai, Tai Ying, Lin, Han‐Ting, Kuo, Tsung‐Rong, Chen, Hsiao‐Chien, Tseng, Chun‐Sheng, Tung, Ching‐Wei, Chien, Chia‐Ying, Chen, Hao Ming
Format Journal Article
LanguageEnglish
Published 12.08.2024
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Summary:Light‐induced dynamic metal nanocrystal/semiconductor interfaces during carbon dioxide electroreduction were investigated by utilizing synchrotron radiation X‐ray absorption spectroscopy, as reported by Hao Ming Chen et al. in their Research Article (e202403333). The dynamic structural transformations of metal/semiconductor junction under illumination result in an intriguing selectivity switch and realize an improvement of at least 16‐fold in the product ratio of CH4/C2 products.
Bibliography:These authors contributed equally.
ISSN:1433-7851
1521-3773
DOI:10.1002/anie.202412574