Nanoimaging of Electrical Failure in VO 2 Resistive-Switching Nanodevices

Saved in:

Bibliographic Details
Published in	ACS applied electronic materials Vol. 2; no. 8; pp. 2357 - 2362
Main Authors	Shabalin, Anatoly G., del Valle, Javier, Charnukha, Aliaksei, Hua, Nelson, Holt, Martin V., Basov, Dimitri N., Schuller, Ivan K., Shpyrko, Oleg G.
Format	Journal Article
Language	English
Published	25.08.2020
Online Access	Get full text

Loading…

More Information
ISSN:	2637-6113 2637-6113
DOI:	10.1021/acsaelm.0c00382