Characterization of Ge 2 Sb 2 Te 5 thin film alloys using conductive‐tip atomic force microscopy

Abstract Conductive‐tip atomic force microscopy (C‐AFM) is a powerful tool for investigating the electrical characteristics of phase‐change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of cry...

Full description

Saved in:
Bibliographic Details
Published inphysica status solidi (b) Vol. 249; no. 10; pp. 1945 - 1950
Main Authors Chang, Chia Min, Liu, Yen Ju, Tseng, Ming Lun, Chu, Nien‐Nan, Huang, Ding‐Wei, Mansuripur, Masud, Tsai, Din Ping
Format Journal Article
LanguageEnglish
Published 01.10.2012
Online AccessGet full text

Cover

More Information
Summary:Abstract Conductive‐tip atomic force microscopy (C‐AFM) is a powerful tool for investigating the electrical characteristics of phase‐change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge 2 Sb 2 Te 5 film.
ISSN:0370-1972
1521-3951
DOI:10.1002/pssb.201200356