Study on Adhesive Strength between Ge 2 Sb 2 Te 5 Film and Electrodes for Phase Change Memory Application

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 48; no. 10; p. 101601
Main Authors Liu, Yanbo, Zhang, Ting, Zhang, Guoxin, Niu, Xiaoming, Song, Zhitang, Min, Guoquan, Lin, Yun, Zhang, Jing, Zhou, Weimin, Zhang, Jianping, Chu, Jiangtao, Wan, YongZhong, Feng, Songlin
Format Journal Article
LanguageEnglish
Published 01.10.2009
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.48.101601