Experimental and Theoretical Analysis of Degradation in Ga 2 O 3 –In 2 O 3 –ZnO Thin-Film Transistors

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 48; no. 4S; p. 4
Main Authors Fujii, Mami, Uraoka, Yukiharu, Fuyuki, Takashi, Jung, Ji Sim, Kwon, Jang Yeon
Format Journal Article
LanguageEnglish
Published 01.04.2009
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.48.04C091