Kim, D., Noh, J., Choi, W., & Shim, D. (2025). Biased Poly-gate-separated Schottky Barrier Diode in CMOS. Journal of semiconductor technology and science, 25(4), 414-419. https://doi.org/10.5573/JSTS.2025.25.4.414
Chicago Style (17th ed.) CitationKim, Deokgi, Jaehyun Noh, Wooyeol Choi, and Dongha Shim. "Biased Poly-gate-separated Schottky Barrier Diode in CMOS." Journal of Semiconductor Technology and Science 25, no. 4 (2025): 414-419. https://doi.org/10.5573/JSTS.2025.25.4.414.
MLA (9th ed.) CitationKim, Deokgi, et al. "Biased Poly-gate-separated Schottky Barrier Diode in CMOS." Journal of Semiconductor Technology and Science, vol. 25, no. 4, 2025, pp. 414-419, https://doi.org/10.5573/JSTS.2025.25.4.414.
Warning: These citations may not always be 100% accurate.