Role of p O 2 and film microstructure on the memristive properties of La 2 NiO 4+ δ /LaNiO 3− δ bilayers
LaNiO 3 /La 2 NiO 4 bilayers deposited at varying p O 2 conditions resulted in remarkable differences in film microstructure and cell parameters, directly affecting the electrical behaviour of Pt/LaNiO 3 /La 2 NiO 4 /Pt devices. The devices deposited at low p O 2 showed the largest memristance. We p...
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Published in | Journal of materials chemistry. A, Materials for energy and sustainability Vol. 10; no. 12; pp. 6523 - 6530 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
22.03.2022
|
Online Access | Get full text |
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Abstract | LaNiO
3
/La
2
NiO
4
bilayers deposited at varying
p
O
2
conditions resulted in remarkable differences in film microstructure and cell parameters, directly affecting the electrical behaviour of Pt/LaNiO
3
/La
2
NiO
4
/Pt devices. The devices deposited at low
p
O
2
showed the largest memristance. We propose this is due to the formation of a p-type Schottky contact between LaNiO
3
and La
2
NiO
4
, where the extent of its carrier depletion width can be modulated by the electric-field induced drift of interstitial oxygen ions acting as mobile acceptor dopants in La
2
NiO
4
. |
---|---|
AbstractList | LaNiO
3
/La
2
NiO
4
bilayers deposited at varying
p
O
2
conditions resulted in remarkable differences in film microstructure and cell parameters, directly affecting the electrical behaviour of Pt/LaNiO
3
/La
2
NiO
4
/Pt devices. The devices deposited at low
p
O
2
showed the largest memristance. We propose this is due to the formation of a p-type Schottky contact between LaNiO
3
and La
2
NiO
4
, where the extent of its carrier depletion width can be modulated by the electric-field induced drift of interstitial oxygen ions acting as mobile acceptor dopants in La
2
NiO
4
. |
Author | Lafarge, Valentin Ballesteros, Belén Wulles, Chloé Caicedo Roque, Jose Manuel Burriel, Mónica Santiso, José Maas, Klaasjan |
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CitedBy_id | crossref_primary_10_1002_admt_202200329 crossref_primary_10_1016_j_jallcom_2023_171152 crossref_primary_10_1088_1361_6463_ad1016 crossref_primary_10_1002_admi_202200498 crossref_primary_10_1007_s10854_023_10812_0 |
Cites_doi | 10.1016/j.ssi.2003.12.012 10.1007/978-1-4613-2517-8_33 10.1126/sciadv.aau8467 10.1038/ncomms4990 10.1002/adfm.201909942 10.1039/B711341B 10.1021/acs.jpcc.6b05666 10.1016/0167-577X(95)00199-9 10.1063/1.4731249 10.1039/C9TC03972D 10.1021/cm401714d 10.1039/C8FD00108A 10.1016/j.ssi.2019.01.027 10.1039/B605886H 10.1002/9783527680870.ch15 10.1016/S0167-2738(02)00182-0 10.1039/B917118E 10.1016/0921-5107(89)90164-5 |
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References | Detemple (D1TA10296F/cit18/1) 2012; 112 Baeumer (D1TA10296F/cit4/1) 2019; 213 Lenser (D1TA10296F/cit3/1) 2016 Riess (D1TA10296F/cit1/1) 2003; 157 Maas (D1TA10296F/cit5/1) 2020; 8 Bagdzevicius (D1TA10296F/cit19/1) 2019; 334 Burriel (D1TA10296F/cit11/1) 2016; 120 Zhu (D1TA10296F/cit16/1) 2019; 5 Yu (D1TA10296F/cit14/1) 1996; 26 Bassat (D1TA10296F/cit12/1) 1989; 3 Chroneos (D1TA10296F/cit8/1) 2010; 20 Bassat (D1TA10296F/cit9/1) 2004; 167 Burriel (D1TA10296F/cit10/1) 2008; 18 Aguadero (D1TA10296F/cit7/1) 2006; 16 Mikheev (D1TA10296F/cit17/1) 2014; 5 Maas (D1TA10296F/cit6/1) 2020; 30 Honig (D1TA10296F/cit13/1) 1985 Moreno (D1TA10296F/cit15/1) 2013; 25 Kilner (D1TA10296F/cit2/1) 2014; 44 |
References_xml | – volume: 167 start-page: 341 year: 2004 ident: D1TA10296F/cit9/1 publication-title: Solid State Ionics doi: 10.1016/j.ssi.2003.12.012 contributor: fullname: Bassat – start-page: 409 volume-title: Localization and Metal-Insulator Transitions year: 1985 ident: D1TA10296F/cit13/1 doi: 10.1007/978-1-4613-2517-8_33 contributor: fullname: Honig – volume: 5 start-page: eaau8467 year: 2019 ident: D1TA10296F/cit16/1 publication-title: Sci. Adv. doi: 10.1126/sciadv.aau8467 contributor: fullname: Zhu – volume: 5 start-page: 3990 year: 2014 ident: D1TA10296F/cit17/1 publication-title: Nat. Commun. doi: 10.1038/ncomms4990 contributor: fullname: Mikheev – volume: 30 start-page: 1909942 year: 2020 ident: D1TA10296F/cit6/1 publication-title: Adv. Funct. Mater. doi: 10.1002/adfm.201909942 contributor: fullname: Maas – volume: 18 start-page: 416 year: 2008 ident: D1TA10296F/cit10/1 publication-title: J. Mater. Chem. doi: 10.1039/B711341B contributor: fullname: Burriel – volume: 120 start-page: 17927 year: 2016 ident: D1TA10296F/cit11/1 publication-title: J. Phys. Chem. C doi: 10.1021/acs.jpcc.6b05666 contributor: fullname: Burriel – volume: 26 start-page: 73 year: 1996 ident: D1TA10296F/cit14/1 publication-title: Mater. Lett. doi: 10.1016/0167-577X(95)00199-9 contributor: fullname: Yu – volume: 112 start-page: 013509 year: 2012 ident: D1TA10296F/cit18/1 publication-title: J. Appl. Phys. doi: 10.1063/1.4731249 contributor: fullname: Detemple – volume: 44 volume-title: Materials for intermediate-temperature solid-oxide fuel cells year: 2014 ident: D1TA10296F/cit2/1 contributor: fullname: Kilner – volume: 8 start-page: 464 year: 2020 ident: D1TA10296F/cit5/1 publication-title: J. Mater. Chem. C doi: 10.1039/C9TC03972D contributor: fullname: Maas – volume: 25 start-page: 3640 year: 2013 ident: D1TA10296F/cit15/1 publication-title: Chem. Mater. doi: 10.1021/cm401714d contributor: fullname: Moreno – volume: 213 start-page: 215 year: 2019 ident: D1TA10296F/cit4/1 publication-title: Faraday Discuss. doi: 10.1039/C8FD00108A contributor: fullname: Baeumer – volume: 334 start-page: 29 year: 2019 ident: D1TA10296F/cit19/1 publication-title: Solid State Ionics doi: 10.1016/j.ssi.2019.01.027 contributor: fullname: Bagdzevicius – volume: 16 start-page: 3402 year: 2006 ident: D1TA10296F/cit7/1 publication-title: J. Mater. Chem. doi: 10.1039/B605886H contributor: fullname: Aguadero – start-page: 437 volume-title: Resistive Switching year: 2016 ident: D1TA10296F/cit3/1 doi: 10.1002/9783527680870.ch15 contributor: fullname: Lenser – volume: 157 start-page: 1 year: 2003 ident: D1TA10296F/cit1/1 publication-title: Solid State Ionics doi: 10.1016/S0167-2738(02)00182-0 contributor: fullname: Riess – volume: 20 start-page: 266 year: 2010 ident: D1TA10296F/cit8/1 publication-title: J. Mater. Chem. doi: 10.1039/B917118E contributor: fullname: Chroneos – volume: 3 start-page: 507 year: 1989 ident: D1TA10296F/cit12/1 publication-title: Mater. Sci. Eng., B doi: 10.1016/0921-5107(89)90164-5 contributor: fullname: Bassat |
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Snippet | LaNiO
3
/La
2
NiO
4
bilayers deposited at varying
p
O
2
conditions resulted in remarkable differences in film microstructure and cell parameters, directly... |
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Title | Role of p O 2 and film microstructure on the memristive properties of La 2 NiO 4+ δ /LaNiO 3− δ bilayers |
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