Validation of 64 Cu-ATSM damaging DNA via high-LET Auger electron emission

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Bibliographic Details
Published in	Journal of radiation research Vol. 56; no. 5; pp. 784 - 791
Main Authors	McMillan, Dayton D., Maeda, Junko, Bell, Justin J., Genet, Matthew D., Phoonswadi, Garrett, Mann, Kelly A., Kraft, Susan L., Kitamura, Hisashi, Fujimori, Akira, Yoshii, Yukie, Furukawa, Takako, Fujibayashi, Yasuhisa, Kato, Takamitsu A.
Format	Journal Article
Language	English
Published	01.09.2015
Online Access	Get full text

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ISSN:	0449-3060 1349-9157
DOI:	10.1093/jrr/rrv042