Influence of the thickness of a SiO 2 reflective layer on the performance of a structured CsI(Tl) scintillation screen based on an oxidized Si micropore array template in X-ray imaging

• Published in: Optics express Vol. 30; no. 12; p. 21324
• Main Authors: Sun, Zhixiang, Gu, Mu, Teng, Yunxue, Liu, Xiaolin, Liu, Bo, Zhang, Juannan, Huang, Shiming, Ni, Chen
• Format: Journal Article
• Language: English
• Published: 06.06.2022
• ISSN: 1094-4087; 1094-4087
• DOI: 10.1364/OE.459637

To obtain better light guidance and optical isolation effects under a limited microcolumn wall thickness, the influence of the thickness of a SiO 2 reflective layer on the performance of a structured CsI(Tl) scintillation screen based on an oxidized Si micropore array template in X-ray imaging was simulated. The results show that the SiO 2 reflective layer should maintain a certain thickness to achieve good light-guide performance. However, if the template is entirely composed of SiO 2 , the light isolation performance of the microcolumn wall will be slightly worse. The results provide a basis for optimizing the thickness of SiO 2 reflective layer.