Characterization of Initial Parameter Information for Lifetime Prediction of Electronic Devices

• Published in: PloS one Vol. 11; no. 12; p. e0167429
• Main Authors: Li, Zhigang, Liu, Boying, Yuan, Mengxiong, Zhang, Feifei, Guo, Jiaqiang
• Format: Journal Article
• Language: English
• Published: United States Public Library of Science 01.12.2016; Public Library of Science (PLoS)
• Subjects: Algorithms; Analysis; Contact resistance; Curve fitting; Defects; Electrical engineering; Electromagnetic Radiation; Electromagnetism; Electromechanical devices; Electronic devices; Electronic equipment; Electronics - instrumentation; Electronics - standards; Engineering and Technology; Humans; Lifetime; Magnetic properties; Mathematical models; Methods; Models, Theoretical; Parameter estimation; Parameters; Performance evaluation; Physical Sciences; Prediction models; Research and Analysis Methods; Service life assessment; Stability; Variables; China
• ISSN: 1932-6203; 1932-6203
• DOI: 10.1371/journal.pone.0167429

Newly manufactured electronic devices are subject to different levels of potential defects existing among the initial parameter information of the devices. In this study, a characterization of electromagnetic relays that were operated at their optimal performance with appropriate and steady parameter values was performed to estimate the levels of their potential defects and to develop a lifetime prediction model. First, the initial parameter information value and stability were quantified to measure the performance of the electronics. In particular, the values of the initial parameter information were estimated using the probability-weighted average method, whereas the stability of the parameter information was determined by using the difference between the extrema and end points of the fitting curves for the initial parameter information. Second, a lifetime prediction model for small-sized samples was proposed on the basis of both measures. Finally, a model for the relationship of the initial contact resistance and stability over the lifetime of the sampled electromagnetic relays was proposed and verified. A comparison of the actual and predicted lifetimes of the relays revealed a 15.4% relative error, indicating that the lifetime of electronic devices can be predicted based on their initial parameter information.