Intermetallic compounds in 3D integrated circuits technology: a brief review
The high performance and downsizing technology of three-dimensional integrated circuits (3D-ICs) for mobile consumer electronic products have gained much attention in the microelectronics industry. This has been driven by the utilization of chip stacking by through-Si-via and solder microbumps. Pb-f...
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Published in | Science and technology of advanced materials Vol. 18; no. 1; pp. 693 - 703 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
United States
Taylor & Francis
31.12.2017
Taylor & Francis Ltd Taylor & Francis Group |
Subjects | |
Online Access | Get full text |
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Summary: | The high performance and downsizing technology of three-dimensional integrated circuits (3D-ICs) for mobile consumer electronic products have gained much attention in the microelectronics industry. This has been driven by the utilization of chip stacking by through-Si-via and solder microbumps. Pb-free solder microbumps are intended to replace conventional Pb-containing solder joints due to the rising awareness of environmental preservation. The use of low-volume solder microbumps has led to crucial constraints that cause several reliability issues, including excessive intermetallic compounds (IMCs) formation and solder microbump embrittlement due to IMCs growth. This article reviews technologies related to 3D-ICs, IMCs formation mechanisms and reliability issues concerning IMCs with Pb-free solder microbumps. Finally, future outlook on the potential growth of research in this area is discussed. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-3 content type line 23 ObjectType-Review-1 |
ISSN: | 1468-6996 1878-5514 |
DOI: | 10.1080/14686996.2017.1364975 |