Instantaneous sea ice drift speed from TanDEM-X interferometry
The drift of sea ice is an important geophysical process with widespread implications for the ocean energy budget and ecosystems. Drifting sea ice can also threaten marine operations and present a hazard for ocean vessels and installations. Here, we evaluate single-pass along-track synthetic apertur...
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Published in | The cryosphere Vol. 13; no. 4; pp. 1395 - 1408 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Katlenburg-Lindau
Copernicus GmbH
29.04.2019
Copernicus Publications |
Subjects | |
Online Access | Get full text |
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Summary: | The drift of sea ice is an important geophysical process with
widespread implications for the ocean energy budget and ecosystems. Drifting
sea ice can also threaten marine operations and present a hazard for ocean
vessels and installations. Here, we evaluate single-pass along-track
synthetic aperture radar (SAR) interferometry (S-ATI) as a tool to assess
ice drift while discussing possible applications and inherent limitations.
Initial validation shows that TanDEM-X phase-derived drift speed corresponds
well with drift products from a ground-based radar at Utqiaġvik, Alaska.
Joint analysis of TanDEM-X and Sentinel-1 data covering the Fram Strait
demonstrates that S-ATI can help quantify the opening/closing rate of leads
with possible applications for navigation. S-ATI enables an instantaneous
assessment of ice drift and dynamic processes that are otherwise difficult
to observe. For instance, by evaluating sea ice drift through the Vilkitsky
Strait, Russia, we identified short-lived transient convergence patterns. We
conclude that S-ATI enables the identification and analysis of potentially
important dynamic processes (e.g., drift, rafting, and ridging). However,
current limitations of S-ATI are significant (e.g., data availability and
they presently only provide the cross-track vector component of the ice drift
field) but may be significantly reduced with future SAR systems. |
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ISSN: | 1994-0424 1994-0416 1994-0424 1994-0416 |
DOI: | 10.5194/tc-13-1395-2019 |