电子背散射衍射技术在Mg/Al金属焊接中的应用
电子背散射衍射(EBSD)可以提供晶体结构、晶体取向、相分布及鉴别、晶界、应力应变分析等信息,是有效的材料分析方法。离子束截面抛光具有无剪切应力残留,无磨料污染,无划痕,试样损伤小等优点,适合于Mg/Al异种金属焊接层试样的制备。利用EBSD可以快速准确地观察Mg/Al异种金属焊接层母材Al相、Al侧过渡区、扩散区的晶粒形状、尺寸及分布情况。根据Mg/Al异种金属焊接层各相的EBSD菊池衍射花样及能谱的定性定量结果,实现了对焊接层的相鉴定、织构、晶界角的分析。...
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Published in | 实验室研究与探索 Vol. 35; no. 1; pp. 27 - 30 |
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Main Author | |
Format | Journal Article |
Language | Chinese |
Published |
上海市计量测试技术研究院,上海,201203%中国科学院上海硅酸盐研究所,上海,200050
2016
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Subjects | |
Online Access | Get full text |
ISSN | 1006-7167 |
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Summary: | 电子背散射衍射(EBSD)可以提供晶体结构、晶体取向、相分布及鉴别、晶界、应力应变分析等信息,是有效的材料分析方法。离子束截面抛光具有无剪切应力残留,无磨料污染,无划痕,试样损伤小等优点,适合于Mg/Al异种金属焊接层试样的制备。利用EBSD可以快速准确地观察Mg/Al异种金属焊接层母材Al相、Al侧过渡区、扩散区的晶粒形状、尺寸及分布情况。根据Mg/Al异种金属焊接层各相的EBSD菊池衍射花样及能谱的定性定量结果,实现了对焊接层的相鉴定、织构、晶界角的分析。 |
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Bibliography: | field emission scanning electron microscopy; electron back-scattering diffraction(EBSD); ion cross-sections milling; phase identification ZHOU Ying,WANG Hu,WU Wei,ZENG Yi(1. Shanghai Institute of Measurement and Testing Technology, Shanghai 201203, China; 2. Shanghai Institute of Ceramies Chinese Academy of Sciences, Shanghai 200050, China) Electron channeling contrast imaging and electron back-scattering diffraction can provide the crystal structure,crystal orientation,phase distribution and identification,grain boundary,stress analysis and other information,hence,they are effective methods for analysis of materials. Ion cross-sections milling has the advantages of no shear stress residual,no abrasive contamination,no scratches,and small sample damage,therefore,it is suitable for the specimen preparation of Mg / Al dissimilar alloy welding layer. The grain shape,size and distribution of the base material Al,Al transition zone,and diffusion zone of Mg / Al dissimilar metal welding layer can be observed rapidly |
ISSN: | 1006-7167 |