薄膜太阳电池器件电学性能测试系统设计

为了实现变温环境下薄膜太阳电池电学性能的自动测试,提出了基于方形四探针法测试原理,采用由工业计算机（IPC）和Keithley 2401数字源表、智能温控仪（SRS13A,SRS14A）组成的主从式控制系统,实现薄膜太阳电池器件的电学性能测试。通过RS-485总线完成智能温控仪与上位机间数据通信,达到对测试环境和样品温度的智能控制。采用GPIB总线实现上位机与Keithly 2401数字源表间的信息交换,获取待测样品的电压、电流、电阻等参数值。基于Lab VIEW开发环境编写的上位机软件被用于完成数据处理,T—R,T—I—U特征曲线的绘制和显示。为了验证该测试系统的性能,对化合物半导体（Zn...

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Bibliographic Details
Published in实验室研究与探索 Vol. 36; no. 10; pp. 91 - 95
Main Author 王一舒;陆小龙;王文武
Format Journal Article
LanguageChinese
Published 四川大学锦城学院,成都,610065%四川大学制造科学与工程学院,成都,610065%四川大学材料科学与工程学院,成都,610065 2017
Subjects
测试系统
电学性能
薄膜太阳电池
test system
thin film solar cells
测试系统
electrical properties
电学性能
薄膜太阳电池
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ISSN1006-7167
DOI10.3969/j.issn.1006-7167.2017.10.022

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Summary:为了实现变温环境下薄膜太阳电池电学性能的自动测试,提出了基于方形四探针法测试原理,采用由工业计算机（IPC）和Keithley 2401数字源表、智能温控仪（SRS13A,SRS14A）组成的主从式控制系统,实现薄膜太阳电池器件的电学性能测试。通过RS-485总线完成智能温控仪与上位机间数据通信,达到对测试环境和样品温度的智能控制。采用GPIB总线实现上位机与Keithly 2401数字源表间的信息交换,获取待测样品的电压、电流、电阻等参数值。基于Lab VIEW开发环境编写的上位机软件被用于完成数据处理,T—R,T—I—U特征曲线的绘制和显示。为了验证该测试系统的性能,对化合物半导体（Zn Te：Cu）薄膜和Cd Te薄膜太阳电池器件的电学性能进行了测试。结果表明,该系统能够完成变温环境下薄膜太阳电池器件电学性能的测试,并且该系统运行可靠、操作简便,能够满足实验室教学和科研的需要。
Bibliography:WANG Yishu1, LU, Xiaolong2a , WANG Wenwu2b （1. College of Jincheng Sichuan University; 2a. School of Manufacturing Science and Engineering; 2b. School of Material Science and Engineering, Sichuan University,Chengdu 610065, China）
In order to realize the automatic testing of the electrical properties of thin film solar cells under the changing temperature environment, a test system was proposed based on square four-probe principle. The system is mainly composed of an industrial personal computer （ IPC）, a digital source meter （ Keithley 2401 ） and two intelligent temperature controllers （SRS13A and S RS14A）. The SRS13A and SRS14A are used to control the test temperature and to monitor the real-time temperature of sample and environment. And the RS-485 serial communication protocol is employed to realize the communication between IPC and intelligent temperature controller. Moreover, the Keithley 2401 is used to measure the voltage, current, and resistance of the sample. And the data exchange between IPC and Keit
ISSN:1006-7167
DOI:10.3969/j.issn.1006-7167.2017.10.022