Critically Evaluated Energy Levels and Spectral Lines of Singly Ionized Indium (In II)
A comprehensive list of the best measured wavelengths in the In II spectrum has been compiled. Uncertainties of the wavelength measurements have been analyzed, and existing inconsistencies have been resolved. An optimized set of fine-structure energy levels that fits all observed wavelengths has bee...
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Published in | Journal of research of the National Institute of Standards and Technology Vol. 118; no. 1; pp. 52 - 104 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
United States
National Institute of Standards and Technology
2013
Superintendent of Documents National Institute of Standards (NIST) [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
Subjects | |
Online Access | Get full text |
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Summary: | A comprehensive list of the best measured wavelengths in the In II spectrum has been compiled. Uncertainties of the wavelength measurements have been analyzed, and existing inconsistencies have been resolved. An optimized set of fine-structure energy levels that fits all observed wavelengths has been derived. Uncertainties of the energy level values have been reduced by an order of magnitude. An improved value of the ionization limit of In II has been determined by fitting quantum-defect and polarization formulas for several series of levels. Intensities of lines observed by different authors have been analyzed and converted to a uniform scale. A set of recommended values of radiative transition rates has been critically compiled, and uncertainties of these rates have been estimated. The hyperfine structure interval in the 5s (2)S ground state of In III has been determined from the measurements of the 5sng and 5snh series in In II. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 National Aeronautics and Space Administration (NASA) USDOE Office of Science (SC), Fusion Energy Sciences (FES) |
ISSN: | 1044-677X 2165-7254 2165-7254 |
DOI: | 10.6028/jres.118.004 |