Epistatic determinism of durum wheat resistance to the wheat spindle streak mosaic virus

Key message The resistance of durum wheat to the Wheat spindle streak mosaic virus (WSSMV) is controlled by two main QTLs on chromosomes 7A and 7B , with a huge epistatic effect. Wheat spindle streak mosaic virus (WSSMV) is a major disease of durum wheat in Europe and North America. Breeding WSSMV-r...

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Published inTheoretical and applied genetics Vol. 130; no. 7; pp. 1491 - 1505
Main Authors Holtz, Yan, Bonnefoy, Michel, Viader, Véronique, Ardisson, Morgane, Rode, Nicolas O., Poux, Gérard, Roumet, Pierre, Marie-Jeanne, Véronique, Ranwez, Vincent, Santoni, Sylvain, Gouache, David, David, Jacques L.
Format Journal Article
LanguageEnglish
Published Berlin/Heidelberg Springer Berlin Heidelberg 01.07.2017
Springer
Springer Nature B.V
Springer Verlag
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Summary:Key message The resistance of durum wheat to the Wheat spindle streak mosaic virus (WSSMV) is controlled by two main QTLs on chromosomes 7A and 7B , with a huge epistatic effect. Wheat spindle streak mosaic virus (WSSMV) is a major disease of durum wheat in Europe and North America. Breeding WSSMV-resistant cultivars is currently the only way to control the virus since no treatment is available. This paper reports studies of the inheritance of WSSMV resistance using two related durum wheat populations obtained by crossing two elite cultivars with a WSSMV-resistant emmer cultivar. In 2012 and 2015, 354 recombinant inbred lines (RIL) were phenotyped using visual notations, ELISA and qPCR and genotyped using locus targeted capture and sequencing. This allowed us to build a consensus genetic map of 8568 markers and identify three chromosomal regions involved in WSSMV resistance. Two major regions (located on chromosomes 7A and 7B) jointly explain, on the basis of epistatic interactions, up to 43% of the phenotypic variation. Flanking sequences of our genetic markers are provided to facilitate future marker-assisted selection of WSSMV-resistant cultivars.
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PMCID: PMC5487696
Communicated by Steven S. Xu.
ISSN:0040-5752
1432-2242
DOI:10.1007/s00122-017-2904-6