Effects of Interface Roughness on Residual Stresses in Thermal Barrier Coatings
Using a newly developed object‐oriented finite‐element analysis method, both an actual microstructure and model microstructures of a plasma‐sprayed thermal barrier coating system were numerically simulated to analyze the full‐field residual stresses of this coating system. Residual stresses in the a...
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Published in | Journal of the American Ceramic Society Vol. 82; no. 4; pp. 1073 - 1075 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Westerville, Ohio
American Ceramics Society
01.04.1999
Blackwell Wiley Subscription Services, Inc |
Subjects | |
Online Access | Get full text |
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Summary: | Using a newly developed object‐oriented finite‐element analysis method, both an actual microstructure and model microstructures of a plasma‐sprayed thermal barrier coating system were numerically simulated to analyze the full‐field residual stresses of this coating system. Residual stresses in the actual microstructure were influenced by both the irregular top‐coat/bond‐coat interface and cracks in the top coat. By treating the microcracked top coat as a more‐compliant solid microstructure, the effects of the irregular interface on residual stresses were examined. These results then could be compared to results that have been obtained by analyzing a model microstructure with a sinusoidal interface, which has been considered by some earlier investigators. |
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Bibliography: | istex:4CAB4E60A289C078CE4D5303FC8590C81AABAEBB ark:/67375/WNG-5MWCGMZQ-T ArticleID:JACE1073 Member, American Ceramic Society. A. G. Evans—contributing editor Sponsored primarily by the U.S. Department of Energy, Division of Materials Sciences, Office of Basic Energy Sciences, under Contract No. DE‐AC05‐96OR22464 with Lockheed Martin Energy Research Corp. Presently at Massachusetts Institute of Technology, Cambridge, MA 02139‐4307. ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0002-7820 1551-2916 |
DOI: | 10.1111/j.1151-2916.1999.tb01878.x |