Sample preparation and data collection for serial block face scanning electron microscopy of mammalian cell monolayers
Volume electron microscopy encompasses a set of electron microscopy techniques that can be used to examine the ultrastructure of biological tissues and cells in three dimensions. Two block face techniques, focused ion beam scanning electron microscopy (FIB-SEM) and serial block face scanning electro...
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Published in | PloS one Vol. 19; no. 8; p. e0301284 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
Public Library of Science
09.08.2024
Public Library of Science (PLoS) |
Subjects | |
Online Access | Get full text |
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Summary: | Volume electron microscopy encompasses a set of electron microscopy techniques that can be used to examine the ultrastructure of biological tissues and cells in three dimensions. Two block face techniques, focused ion beam scanning electron microscopy (FIB-SEM) and serial block face scanning electron microscopy (SBF-SEM) have often been used to study biological tissue samples. More recently, these techniques have been adapted to
in vitro
tissue culture samples. Here we describe step-by-step protocols for two sample embedding methods for
in vitro
tissue culture cells intended to be studied using SBF-SEM. The first focuses on cell pellet embedding and the second on
en face
embedding.
En face
embedding can be combined with light microscopy, and this CLEM workflow can be used to identify specific biological events by light microscopy, which can then be imaged using SBF-SEM. We systematically outline the steps necessary to fix, stain, embed and image adherent tissue culture cell monolayers by SBF-SEM. In addition to sample preparation, we discuss optimization of parameters for data collection. We highlight the challenges and key steps of sample preparation, and the consideration of imaging variables. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
ISSN: | 1932-6203 1932-6203 |
DOI: | 10.1371/journal.pone.0301284 |