Precise Measurement of Clearance between Two Substrates Using Evanescent Waves

In the material designing process of footwear outer-soles, the rubber grip property under lubricated conditions is important. Generally, friction behaviors of rubber under such conditions are influenced by contact states, which can be changed by various factors, i.e. viscosity, sliding velocity, nor...

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Bibliographic Details
Published inTribology Online Vol. 12; no. 5; pp. 251 - 256
Main Authors Nishi, Toshiaki, Moriyasu, Kenta, Nishiwaki, Tsuyoshi
Format Journal Article
LanguageEnglish
Published Tokyo Japanese Society of Tribologists 01.01.2017
Japan Science and Technology Agency
Subjects
contact condition
evanescent field
Evanescent waves
Film thickness
Footwear
in-situ measuring method
light interferometry
Rubber
Substrates
Surface roughness
total reflection method
Wettability
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Summary:In the material designing process of footwear outer-soles, the rubber grip property under lubricated conditions is important. Generally, friction behaviors of rubber under such conditions are influenced by contact states, which can be changed by various factors, i.e. viscosity, sliding velocity, normal force, surface roughness and wettability between two substrates. To discuss the influences of each parameter, the contact conditions are investigated. The purpose of this study is to establish a new method to measure the distributions of real contact area and film thickness between two substrates based on the decay behavior of an evanescent field in a total reflection method. In conclusion, film thickness was measured with an accuracy of 1 nm in a range of clearance of less than 800 nm.
ISSN:1881-2198
1881-218X
1881-2198
DOI:10.2474/trol.12.251