基于双闪存的大容量冲击波超压测试系统

为了解决冲击波超压测试系统的存储容量小、功耗大的问题，设计了一种基于AVR单片机和CPLD的双闪存冲击波超压测试系统。阐述了存储测试方法，设计了负延时模块，通过CPLD对被测量进行高速采集，使用单片机控制两片闪存交替工作的模式来记录被测信号。根据被测信号的频谱选择了传感器，针对该传感器设计了模拟信号调理电路和数字电路。实验证明将系统应用于爆炸现场可完成对冲击波压力信号的检测和存储。...

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Bibliographic Details
Published in电子技术应用 Vol. 39; no. 11; pp. 85 - 88
Main Author 张海龙 马铁华 谢锐 刘双红
Format Journal Article
LanguageChinese
Published 中北大学电子测试技术国家重点实验室,山西太原030051 2013
中北大学仪器科学与动态测试教育部重点实验室,山西太原030051
Subjects
冲击波
校准
测试系统
超压测试
shock wave
measurement system
冲击波
测试系统
overpressure test
校准
超压测试
calibration
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ISSN0258-7998

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Summary:为了解决冲击波超压测试系统的存储容量小、功耗大的问题，设计了一种基于AVR单片机和CPLD的双闪存冲击波超压测试系统。阐述了存储测试方法，设计了负延时模块，通过CPLD对被测量进行高速采集，使用单片机控制两片闪存交替工作的模式来记录被测信号。根据被测信号的频谱选择了传感器，针对该传感器设计了模拟信号调理电路和数字电路。实验证明将系统应用于爆炸现场可完成对冲击波压力信号的检测和存储。
Bibliography:Zhang Hailong1＇2, Ma Tiehua1＇2, Xie Rui1＇2, Liu Shuanghong1＇2 （1.Key Laboratory of Instrumentation Science ＆ Dynamic Measurement, North University of China,Taiyuan 030051, China; 2. Key Laboratory of Electronic Measurement Technology, North University of China,Taiyuan 030051, China）
shock wave; overpressure test; measurement system; calibration
A double flash memory test system of shock wave overpressure based on AVR MCU and CPLD is designed to solve the problems of small storage capacity, high power consumption in the traditional shock wave test.In this paper,storage test method and negative delay module are described in detail.CPLD is used to produce high-speed sample signal and MCU is used to control two flashes record the tested signal alternately. The sensor was chosen according to frequency spectrum of measured signal. The analog signal conditioning circuit and digital circuit were designed on the basis of sensor type.Experiments show the system applied in explosion field can complete the detection and st
ISSN:0258-7998