Carbon nanotubes pickup by van der Waals force based on nanorobotics manipulation inside SEM
A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by...
Saved in:
Published in | Micro & Nano Letters Vol. 11; no. 10; pp. 645 - 649 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
The Institution of Engineering and Technology
01.10.2016
Institution of Engineering and Technology (IET) |
Subjects | |
Online Access | Get full text |
ISSN | 1750-0443 1750-0443 |
DOI | 10.1049/mnl.2016.0287 |
Cover
Abstract | A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1° and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 µm would increase the probability of picking up CNT successfully. |
---|---|
AbstractList | A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1° and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 µm would increase the probability of picking up CNT successfully. A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1° and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 µm would increase the probability of picking up CNT successfully. A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1[degrees] and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 mu m would increase the probability of picking up CNT successfully. |
Author | Chen, Tao Wang, Yaqiong Sun, Lining Yang, Zhan Fukuda, Toshio |
Author_xml | – sequence: 1 givenname: Zhan surname: Yang fullname: Yang, Zhan organization: 1Key Laboratory of Advanced Robotics and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123, People's Republic of China – sequence: 2 givenname: Tao surname: Chen fullname: Chen, Tao email: chent@suda.edu.cn organization: 1Key Laboratory of Advanced Robotics and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123, People's Republic of China – sequence: 3 givenname: Yaqiong surname: Wang fullname: Wang, Yaqiong organization: 1Key Laboratory of Advanced Robotics and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123, People's Republic of China – sequence: 4 givenname: Lining surname: Sun fullname: Sun, Lining organization: 1Key Laboratory of Advanced Robotics and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123, People's Republic of China – sequence: 5 givenname: Toshio surname: Fukuda fullname: Fukuda, Toshio organization: 3Intelligent Robotics Institute, Beijing Institute of Technology, Beijing 100081, People's Republic of China |
BackLink | https://cir.nii.ac.jp/crid/1873962440314247040$$DView record in CiNii |
BookMark | eNp9kEtv1DAURi1UJNqBJXsvQIJFBr8SJ8syagFppl0AYoNk-XEjuWTsYCdU8-_rIV1UiHZjX-mec_XpO0MnIQZA6DUla0pE92EfhjUjtFkT1spn6JTKmlRECH7yYH6BznK-IURIJrtT9HOjk4kBBx3iNBvIePT21zxic8B_dMAOEv6h9ZBxH5MFbHQGh--FFE2cvM14r4Mf50FPvmx8yN4B_nqxe4me90WFV_f_Cn2_vPi2-Vxtrz992ZxvK1u3dVP10LW6cb3rZNdbAbLTlhsujOBGMy40COdqI3lHe-gt48Cc5VQ7AEOdoHyF3i13xxR_z5AntffZwjDoAHHOirZ1zVvZMVlQvqA2xZwT9Mr66W_uKWk_KErUsUtVulTHLtWxy2JV_1hj8nudDo_yzcLf-gEOT8Nqd3XOPl4S0rZNEd8sYvC-JDu-tNzrGiYE4VQwIUkZVuj9gnmY1E2cUyj1Pprl7X_Y3dX2QYTR9fwOyNmt6Q |
CitedBy_id | crossref_primary_10_1016_j_micron_2020_102978 crossref_primary_10_7498_aps_69_20191298 crossref_primary_10_1016_j_mechatronics_2024_103196 crossref_primary_10_1049_mnl_2020_0108 crossref_primary_10_1155_2017_8563931 crossref_primary_10_1016_j_precisioneng_2024_06_016 crossref_primary_10_3390_mi12030248 crossref_primary_10_5194_ms_12_451_2021 crossref_primary_10_7498_aps_67_20180347 crossref_primary_10_7498_aps_70_20202194 crossref_primary_10_1088_1361_6439_aa7961 |
Cites_doi | 10.1016/S0022‐3697(99)00350‐9 10.1109/TNANO.2004.842073 10.4018/ijimr.2012040103 10.1109/TMECH.2015.2485638 10.1109/NEMS.2016.7758211 10.1109/ROBOT.2009.5152440 10.1007/978‐3‐642‐20329‐9_4 10.1109/IROS.2007.4398979 10.1109/TNANO.2010.2041359 10.1038/srep22534 10.1109/TSM.2004.841816 10.1109/TMECH.2004.828651 10.1021/nn503627h 10.1063/1.1430022 |
ContentType | Journal Article |
Copyright | 2016 The Institution of Engineering and Technology |
Copyright_xml | – notice: 2016 The Institution of Engineering and Technology |
DBID | IDLOA RYH 24P AAYXX CITATION 7TB 7U5 8FD F28 FR3 L7M |
DOI | 10.1049/mnl.2016.0287 |
DatabaseName | IET Digital Library Open Access CiNii Complete Wiley Online Library Open Access CrossRef Mechanical & Transportation Engineering Abstracts Solid State and Superconductivity Abstracts Technology Research Database ANTE: Abstracts in New Technology & Engineering Engineering Research Database Advanced Technologies Database with Aerospace |
DatabaseTitle | CrossRef Solid State and Superconductivity Abstracts Engineering Research Database Technology Research Database Mechanical & Transportation Engineering Abstracts Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | CrossRef Solid State and Superconductivity Abstracts |
Database_xml | – sequence: 1 dbid: IDLOA name: IET Digital Library Open Access url: https://digital-library.theiet.org/content/collections sourceTypes: Enrichment Source Publisher – sequence: 2 dbid: 24P name: Wiley Online Library Open Access url: https://authorservices.wiley.com/open-science/open-access/browse-journals.html sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1750-0443 |
EndPage | 649 |
ExternalDocumentID | 10_1049_mnl_2016_0287 MNA2BF00886 |
Genre | shortCommunication |
GrantInformation_xml | – fundername: National Natural Science Foundation of China grantid: 61433010 – fundername: National Natural Science Foundation of China funderid: 61433010 |
GroupedDBID | - 0R 123 24P 29M 4.4 6IK 8FE 8FG AAJGR ABJCF ACGFS ACIWK AENEX AFKRA ALMA_UNASSIGNED_HOLDINGS ARAPS BENPR BFFAM BGLVJ CS3 D1I DU5 EBS EJD F5P HCIFZ HZ IDLOA IFIPE IPLJI JAVBF KB. L6V LAI LOTEE LXI LXU M43 M7S NADUK NXXTH O9- OCL P2P P62 PDBOC PTHSS RIE RIG RNS RUI S0W UNMZH UNR --- 0R~ 0ZK 1OC AAHHS AAHJG ABMDY ABQXS ACCFJ ACCMX ACXQS ADEYR AEEZP AEQDE AIWBW AJBDE ALUQN AVUZU GROUPED_DOAJ HZ~ IFBGX MCNEO M~E OK1 RYH ACESK CCPQU IAO IGS IHR INH ITC ROL AAMMB AAYXX AEFGJ AGXDD AIDQK AIDYY CITATION PHGZM PHGZT PQGLB PUEGO WIN 7TB 7U5 8FD F28 FR3 L7M |
ID | FETCH-LOGICAL-c5856-fe98a6dfd979fc4e79ac3b34b43ba234ae4dd5b7391fefc23e2dc31adeeb1d413 |
IEDL.DBID | 24P |
ISSN | 1750-0443 |
IngestDate | Fri Sep 05 05:03:59 EDT 2025 Thu Apr 24 23:13:05 EDT 2025 Wed Sep 10 06:05:07 EDT 2025 Wed Jan 22 16:30:59 EST 2025 Fri Jun 27 00:44:54 EDT 2025 Tue Jan 05 21:44:33 EST 2021 Thu May 09 18:26:34 EDT 2019 |
IsDoiOpenAccess | true |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 10 |
Keywords | scanning electron microscopy van der Waals force C probability nanofabrication nanorobotic manipulator effector contacting models end effector carbon nanotubes pickup contact length atomic force microscope cantilever CNT picking up pickup contact area SEM |
Language | English |
License | Attribution http://creativecommons.org/licenses/by/3.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c5856-fe98a6dfd979fc4e79ac3b34b43ba234ae4dd5b7391fefc23e2dc31adeeb1d413 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
OpenAccessLink | https://onlinelibrary.wiley.com/doi/abs/10.1049%2Fmnl.2016.0287 |
PQID | 1855387927 |
PQPubID | 23500 |
PageCount | 5 |
ParticipantIDs | proquest_miscellaneous_1855387927 nii_cinii_1873962440314247040 crossref_citationtrail_10_1049_mnl_2016_0287 wiley_primary_10_1049_mnl_2016_0287_MNA2BF00886 iet_journals_10_1049_mnl_2016_0287 crossref_primary_10_1049_mnl_2016_0287 |
ProviderPackageCode | IDLOA RUI |
PublicationCentury | 2000 |
PublicationDate | 20161000 2016-10-01 October 2016 2016-10-00 20161001 |
PublicationDateYYYYMMDD | 2016-10-01 |
PublicationDate_xml | – month: 10 year: 2016 text: 20161000 |
PublicationDecade | 2010 |
PublicationTitle | Micro & Nano Letters |
PublicationYear | 2016 |
Publisher | The Institution of Engineering and Technology Institution of Engineering and Technology (IET) |
Publisher_xml | – name: The Institution of Engineering and Technology – name: Institution of Engineering and Technology (IET) |
References | Thompson, S.E.; Chau, R.S.; Ghani, T. (C3) 2005; 18 Dong, L.; Fukuda, T.; Arai, F. (C15) 2008; 2 Fatikow, S.; Bartenwerfer, M. (C9) 2012; 2 Tulevski, G.S.; Franklin, A.D.; Frank, D. (C4) 2014; 8 Shen, Y.; Nakajima, M.; Zhang, Z. (C10) 2015; 20 Xie, H.; Onal, C.; Régnier, S. (C12) 2012; 71 Li, G.; Xi, N.; Yu, M. (C13) 1960; 9 Xie, H.; RéGnier, S. (C14) 2012; 11 Chau, R.; Datta, S.; Doczy, M. (C2) 2005; 4 Kuzumaki, T.; Sawada, H.; Ichinose, H. (C5) 2001; 79 Wang, Z.L.; Poncharal, P.; Heer, W.A.D. (C8) 2000; 61 Shang, W.F.; Lu, H.J.; Wan, W.F. (C11) 2016; 6 2012; 71 2016; 6 2012; 2 2015; 20 2009 2000; 61 2005; 4 2007 2016 1960; 9 2014; 8 2008; 2 2001; 79 2005; 18 2012; 11 e_1_2_8_12_2 Dong L. (e_1_2_8_16_2) 2008; 2 e_1_2_8_13_2 e_1_2_8_14_2 e_1_2_8_15_2 e_1_2_8_9_2 e_1_2_8_2_2 e_1_2_8_4_2 e_1_2_8_3_2 e_1_2_8_6_2 e_1_2_8_5_2 e_1_2_8_8_2 e_1_2_8_7_2 e_1_2_8_10_2 e_1_2_8_11_2 |
References_xml | – volume: 2 start-page: 34 issue: 2 year: 2012 end-page: 46 ident: C9 article-title: Nanorobot-based handling and transfer of individual silicon nanowires publication-title: Int. J. Intell. Mechatronics Robot. – volume: 9 start-page: 358 issue: 2 year: 1960 end-page: 365 ident: C13 article-title: Development of augmented reality system for AFM-based nanomanipulation publication-title: IEEE/ASME Trans. Mechatronics – volume: 2 start-page: 264 issue: 3 year: 2008 end-page: 275 ident: C15 article-title: Nanorobotic systems publication-title: Int. J. Adv. Robot. Syst. – volume: 79 start-page: 4580 issue: 27 year: 2001 end-page: 4582 ident: C5 article-title: Selective processing of individual carbon nanotubes using dual-nanomanipulator installed in transmission electron microscope publication-title: J. Appl. Phys. Lett. – volume: 61 start-page: 1025 issue: 7 year: 2000 end-page: 1030 ident: C8 article-title: Measuring physical and mechanical properties of individual carbon nanotubes by in situ TEM publication-title: J. Phys. Chem. Solids – volume: 11 start-page: 21 issue: 1 year: 2012 end-page: 33 ident: C14 article-title: High-efficiency automated nanomanipulation with parallel imaging/manipulation force microscopy publication-title: IEEE Trans. Nanotechnol. – volume: 4 start-page: 153 issue: 2 year: 2005 end-page: 158 ident: C2 article-title: Benchmarking nanotechnology for high-performance and low-power logic transistor applications publication-title: IEEE Trans. Nanotechnol. – volume: 6 start-page: 22534 year: 2016 ident: C11 article-title: Vision-based nano robotic system for high-throughput non-embedded cell cutting publication-title: Sci. Rep. – volume: 8 start-page: 8730 issue: 9 year: 2014 end-page: 8745 ident: C4 article-title: Toward high-performance digital logic technology with carbon nanotubes publication-title: J. Acs Nano – volume: 20 start-page: 1 issue: 6 year: 2015 end-page: 9 ident: C10 article-title: Dynamic force characterization microscopy based on integrated nanorobotic AFM and SEM system for detachment process study publication-title: IEEE/ASME Trans. Mechatronics – volume: 71 start-page: 87 year: 2012 end-page: 143 ident: C12 article-title: Atomic force microscopy based nanorobotics publication-title: J. Springer Tracts Adv. Robot. – volume: 18 start-page: 26 issue: 1 year: 2005 end-page: 36 ident: C3 article-title: In search of ‘Forever’, continued transistor scaling one new material at a time publication-title: IEEE Trans. Semiconductor Manuf. – start-page: 1826 year: 2009 end-page: 1831 article-title: NanoLab: a nanorobotic system for automated pick‐and‐place handling and characterization of CNTs – year: 2016 article-title: CNT handling with van der Waals force inside a SEM for FET application – volume: 4 start-page: 153 issue: 2 year: 2005 end-page: 158 article-title: Benchmarking nanotechnology for high‐performance and low‐power logic transistor applications publication-title: IEEE Trans. Nanotechnol. – volume: 8 start-page: 8730 issue: 9 year: 2014 end-page: 8745 article-title: Toward high‐performance digital logic technology with carbon nanotubes publication-title: J. Acs Nano – volume: 2 start-page: 34 issue: 2 year: 2012 end-page: 46 article-title: Nanorobot‐based handling and transfer of individual silicon nanowires publication-title: Int. J. Intell. Mechatronics Robot. – volume: 79 start-page: 4580 issue: 27 year: 2001 end-page: 4582 article-title: Selective processing of individual carbon nanotubes using dual‐nanomanipulator installed in transmission electron microscope publication-title: J. Appl. Phys. Lett. – volume: 9 start-page: 358 issue: 2 year: 1960 end-page: 365 article-title: Development of augmented reality system for AFM‐based nanomanipulation publication-title: IEEE/ASME Trans. Mechatronics – volume: 6 start-page: 22534 year: 2016 article-title: Vision‐based nano robotic system for high‐throughput non‐embedded cell cutting publication-title: Sci. Rep. – start-page: 291 year: 2007 end-page: 296 article-title: Nanorobotic manipulation setup for pick‐and‐place handling and nondestructive characterization of carbon nanotubes – volume: 11 start-page: 21 issue: 1 year: 2012 end-page: 33 article-title: High‐efficiency automated nanomanipulation with parallel imaging/manipulation force microscopy publication-title: IEEE Trans. Nanotechnol. – volume: 20 start-page: 1 issue: 6 year: 2015 end-page: 9 article-title: Dynamic force characterization microscopy based on integrated nanorobotic AFM and SEM system for detachment process study publication-title: IEEE/ASME Trans. Mechatronics – volume: 61 start-page: 1025 issue: 7 year: 2000 end-page: 1030 article-title: Measuring physical and mechanical properties of individual carbon nanotubes by in situ TEM publication-title: J. Phys. Chem. Solids – volume: 71 start-page: 87 year: 2012 end-page: 143 article-title: Atomic force microscopy based nanorobotics publication-title: J. Springer Tracts Adv. Robot. – volume: 18 start-page: 26 issue: 1 year: 2005 end-page: 36 article-title: In search of ‘Forever’, continued transistor scaling one new material at a time publication-title: IEEE Trans. Semiconductor Manuf. – volume: 2 start-page: 264 issue: 3 year: 2008 end-page: 275 article-title: Nanorobotic systems publication-title: Int. J. Adv. Robot. Syst. – ident: e_1_2_8_9_2 doi: 10.1016/S0022‐3697(99)00350‐9 – ident: e_1_2_8_3_2 doi: 10.1109/TNANO.2004.842073 – ident: e_1_2_8_10_2 doi: 10.4018/ijimr.2012040103 – ident: e_1_2_8_11_2 doi: 10.1109/TMECH.2015.2485638 – ident: e_1_2_8_2_2 doi: 10.1109/NEMS.2016.7758211 – ident: e_1_2_8_8_2 doi: 10.1109/ROBOT.2009.5152440 – ident: e_1_2_8_13_2 doi: 10.1007/978‐3‐642‐20329‐9_4 – ident: e_1_2_8_7_2 doi: 10.1109/IROS.2007.4398979 – ident: e_1_2_8_15_2 doi: 10.1109/TNANO.2010.2041359 – ident: e_1_2_8_12_2 doi: 10.1038/srep22534 – ident: e_1_2_8_4_2 doi: 10.1109/TSM.2004.841816 – ident: e_1_2_8_14_2 doi: 10.1109/TMECH.2004.828651 – ident: e_1_2_8_5_2 doi: 10.1021/nn503627h – ident: e_1_2_8_6_2 doi: 10.1063/1.1430022 – volume: 2 start-page: 264 issue: 3 year: 2008 ident: e_1_2_8_16_2 article-title: Nanorobotic systems publication-title: Int. J. Adv. Robot. Syst. |
SSID | ssj0047279 ssib057620151 ssib057620152 ssib005901230 ssib053839320 |
Score | 2.1164172 |
Snippet | A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force... |
SourceID | proquest crossref wiley nii iet |
SourceType | Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 645 |
SubjectTerms | atomic force microscope cantilever Carbon nanotubes CNT picking up contacting models end effector End effectors Mathematical models nanofabrication nanorobotic manipulator effector Nanostructure Picking pickup contact area pickup contact length probability Scanning electron microscopy SEM Special Issue: Selected Papers from The 11th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE-NEMS 2016) Strategy van der Waals force Van der Waals forces |
SummonAdditionalLinks | – databaseName: IET Digital Library Open Access dbid: IDLOA link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwELba7QUOqLzEUloZhDgRtnG8dnxsS1cFtb1ARQ9Ike2xqwhwVsvuof-emTzarlARFytSxhp7Jpn57LFnGHsrcWnsxLTM9j1AJumej4lQZqDKEI1TGmJ7yvdcnVzIz5fTyw02VBuF-opqZWTDjhvtlofu5gEd3UY7POll3BUkQXw7-ZUohJCrD-gq9SbbElrvlyO29enjKS2vOqss0U-bPsfmX53WfNImMsQ21fUa6LwLXVvfM9tmj3rQyA86LT9mGyE9YQ_vpBJ8yr4f2YVrEk82NcuVC7_5vPY_VnPurjmCZQ5hwb9ZnBBHlOoDJ-8FvO-waFxD6Zo5JcMYCnrxui3lyb8cnz1jF7Pjr0cnWV85IfMI_1UWgymtgghGm-hl0Mb6whXSycJZUUgbJMDU6cLkMUQviiDAF7mFgKYb0K89Z6PUpPCCcSeNlaCcx1YKyE0wQlmKBnpcavg4Zu8H2VW-TytO1S1-Vm14W5oKRV2RqCsS9Zi9uyGfd_k07iN8g4qoBm3fR7S3RnR2fnr7spoDjm4XFYkDozYvccIK8Qyl7BdSo_0as9eDiiv8ryhYYlNoVsivnKIv0EYgk0mr-3-PF3kfiMMZQqpSvfyfse-wB_TcHQx8xUbLxSrsIsBZur3-2_0DjcX1DQ priority: 102 providerName: Institution of Engineering and Technology |
Title | Carbon nanotubes pickup by van der Waals force based on nanorobotics manipulation inside SEM |
URI | http://digital-library.theiet.org/content/journals/10.1049/mnl.2016.0287 https://cir.nii.ac.jp/crid/1873962440314247040 https://onlinelibrary.wiley.com/doi/abs/10.1049%2Fmnl.2016.0287 https://www.proquest.com/docview/1855387927 |
Volume | 11 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3db9MwELfo9gIPaHyJAqsMQjwRRhzHiR-7rdVA7UAaE3tAimyfLUWAU3XtAy_723eXpGN9GBIvieScY-fO5_s5Z98x9lbi0tiKvEw-OoBE0jkfHaBMQJU-aKsKCO0u31N1ci4_X-QXfZ5TOgvTxYe4-eFGmtHO16TgxnZZSBDUohB_R_IcpOoDWshiwHbpeC3lbhDy62YqlmicdXsiMqc9jDLrg2ziCw62qm8ZpUHtEWQOYl1voc7b2LU1PtM99rBHjXzcifkRu-fjY_bgVizBJ-zHkVnaJvJoYrNaW3_JF7X7uV5w-4cjWubgl_y7wcHGEaY6z8l8Ae8rLBvbULxmTtEwNhm9eN3m8uRnk_lTdj6dfDs6SfrUCYlD_K-S4HVpFATQhQ5O-kIbl9lMWplZIzJpvATIbZHpNPjgROYFuCw14HHuBjRsz9hObKJ_zriV2khQ1uFVCki110IZcgc6XGu4MGTvN7yrXB9XnNJb_Kpa_7bUFbK6IlZXxOohe3dDvugCatxF-AYFUfUqdXkX0WiLaH46-_uwWgD2bh8FiR2ja1riBysENBSzX8gCJ7Ahe70RcYWKRd4SE32zxvbKHI1BoQU2ctDK_t_9xbbH4nCKmKpUL_67xkt2n8q7bYKv2M5qufb7CHdWdtQO6RHbHR_PZ2d4_3Q8-zLG0vnV5BofTfk7 |
linkProvider | Wiley-Blackwell |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9QwELbYcoAeEE-xfWEQ4kQocSZOfCxVVwvsrpBoRQ9Ilp9SBE1W290D_74zSbbsHorEJZeMY8fjmfnssT8z9hZwamxFXiYfnfcJ0DkfFX2ZeFmGqKwsfGx3-c7k-AK-XOaXG6f4O36I2wU3sozWX5OB04J0N-EEIsm8qil1kMoPGCKLAbsPiM1pU5-Ab2tfDBidVXskMqdNjJD1LJv4geOt4ltRaVAFRJmDuqq2YOcmeG2jz-gxe9TDRn7S6fkJuxfqp2x3g0zwGft5aha2qXlt6ma5suGazyv3azXn9g9HuMx9WPAfBkcbR5zqAqf45XlfYNHYhgibOdFhrK_04lV7mSf_fjZ9zi5GZ-en46S_OyFxOAGQSQyqNNJHrwoVHYRCGZfZDCxk1ogMTADvc1tkKo0hOpEF4V2WGh_QeXuMbC_YTt3U4SXjFpQBL63DJwifqqCENJQPdDjZcHHI3q_7TrueWJzut_it2wQ3KI1dramrNXX1kL27FZ93jBp3Cb5BRejepq7vEjraEprOJn9f6rnH1h2iIrFh9ExL_GGJiIZI-wUU6MGG7PVaxRoti9Ilpg7NCusrc4wGhRJYyXGr-3-3F-s-EZ9GCKpKufffJV6xB-Pz6URPPs--7rOHJNPtGTxgO8vFKhwi9lnao3Z43wA84_hd |
linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3fTxQxEG44SIw-GEENpwLVGJ9cYLvd7vbxRC4gcDHRU0JImv5MNkL3ctw9-N87s7uH3AMkvPRlp-1uZ6bzddt-Q8hHDktjw_Iy2bfOJRzv-cjgysSJ0gdpROFCc8p3JI7G_Nt5ft7lOcW7MC0_xO0PN_SMZr5GB5-40K43OXJkXkfcOUjFLkTIokfWkCkPDH1t8Gt8MV5MxhzCs2zuROZ4ipFnHc0mNLG31MBSWOpVHmBmL1bVEu68i16b8DN8QZ53uJEOWkWvkxUfN8izO2yCL8nlgZ6aOtKoYz2bG39DJ5X9M59Q85cCXqbOT-lvDeZGAahaTzGAOdpVmNamRsZminwYi5xetGqyedIfh2evyHh4-PPgKOmSJyQWVgAiCV6WWrjgZCGD5b6Q2mYm44ZnRrOMa8-dy02RyTT4YFnmmbNZqp2H2dtBaHtNVmMd_SahhkvNnTAWSs5cKr1kQuOGoIXVhg198nkxdsp2zOKY4OJKNTvcXCoYaoVDrXCo--TTrfikpdS4T_ADKEJ1TnVzn9D2ktDZ6PT_QwUm0ydboEh4MSzTEj5YAKRB1n7GC5jC-uT9QsUKXAv3S3T09Rz6K3MIB4Vk0Mleo_uH3xf6HrAvQ0BVpXjz6Bo75Mn3r0N1ejw6eUueokh7ZvAdWZ1N534LsM_MbHf2_Q9plflM |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Carbon+nanotubes+pickup+by+van+der+Waals+force+based+on+nanorobotics+manipulation+inside+SEM&rft.jtitle=Micro+%26+nano+letters&rft.au=Yang%2C+Zhan&rft.au=Chen%2C+Tao&rft.au=Wang%2C+Yaqiong&rft.au=Sun%2C+Lining&rft.date=2016-10-01&rft.pub=The+Institution+of+Engineering+and+Technology&rft.issn=1750-0443&rft.eissn=1750-0443&rft.volume=11&rft.issue=10&rft.spage=645&rft.epage=649&rft_id=info:doi/10.1049%2Fmnl.2016.0287&rft.externalDBID=10.1049%252Fmnl.2016.0287&rft.externalDocID=MNA2BF00886 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1750-0443&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1750-0443&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1750-0443&client=summon |