Carbon nanotubes pickup by van der Waals force based on nanorobotics manipulation inside SEM

A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by...

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Published inMicro & Nano Letters Vol. 11; no. 10; pp. 645 - 649
Main Authors Yang, Zhan, Chen, Tao, Wang, Yaqiong, Sun, Lining, Fukuda, Toshio
Format Journal Article
LanguageEnglish
Published The Institution of Engineering and Technology 01.10.2016
Institution of Engineering and Technology (IET)
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ISSN1750-0443
1750-0443
DOI10.1049/mnl.2016.0287

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Abstract A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1° and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 µm would increase the probability of picking up CNT successfully.
AbstractList A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1° and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 µm would increase the probability of picking up CNT successfully.
A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1° and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 µm would increase the probability of picking up CNT successfully.
A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force microscope cantilever was employed as end effector of nanorobotics manipulators for CNT picking up. A manipulation strategy was established by analysing the van der Waals force of three different types of contacting models. Three groups of experiments were designed and carried out to investigate the effects of different factors. Factors including pickup angle, pickup contact area between the CNT and the cantilever and pickup speed of the end effector were discussed. The results shown that a pickup angle at 90.1[degrees] and a pickup speed lower than 10 nm/step with a pickup contact length more than 1.5 mu m would increase the probability of picking up CNT successfully.
Author Chen, Tao
Wang, Yaqiong
Sun, Lining
Yang, Zhan
Fukuda, Toshio
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Keywords scanning electron microscopy
van der Waals force
C
probability
nanofabrication
nanorobotic manipulator effector
contacting models
end effector
carbon nanotubes
pickup contact length
atomic force microscope cantilever
CNT picking up
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SEM
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Snippet A method of picking up carbon nanotubes (CNTs) from nanotube bulk by van der Waals force inside a scanning electron microscopy is presented. An atomic force...
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SubjectTerms atomic force microscope cantilever
Carbon nanotubes
CNT picking up
contacting models
end effector
End effectors
Mathematical models
nanofabrication
nanorobotic manipulator effector
Nanostructure
Picking
pickup contact area
pickup contact length
probability
Scanning electron microscopy
SEM
Special Issue: Selected Papers from The 11th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE-NEMS 2016)
Strategy
van der Waals force
Van der Waals forces
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Title Carbon nanotubes pickup by van der Waals force based on nanorobotics manipulation inside SEM
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https://cir.nii.ac.jp/crid/1873962440314247040
https://onlinelibrary.wiley.com/doi/abs/10.1049%2Fmnl.2016.0287
https://www.proquest.com/docview/1855387927
Volume 11
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