Structural investigation of GaInP nanowires using X-ray diffraction

• Published in: Thin solid films Vol. 543; no. 100; pp. 100 - 105
• Main Authors: Kriegner, D., Persson, J.M., Etzelstorfer, T., Jacobsson, D., Wallentin, J., Wagner, J.B., Deppert, K., Borgström, M.T., Stangl, J.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 30.09.2013; Elsevier
• Subjects: Condensed Matter Physics; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Den kondenserade materiens fysik; Diffraction; Exact sciences and technology; Fysik; Gallium; Homogeneity; III-V semiconductors; Materials science; Methods of nanofabrication; Nanocrystalline materials; Nanoscale materials and structures: fabrication and characterization; Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals; Nanowires; Natural Sciences; Naturvetenskap; Physical Sciences; Physics; Quantum wires; Recording; Structure of solids and liquids; crystallography; Synchrotrons; X-ray diffraction; X-rays; X-ray diffraction; III–V semiconductors; Nanowires; Reciprocal space; Fluctuations; Reciprocal lattice; Diffraction pattern; XRD; Gallium phosphide; Dispersive spectrometry; Indium phosphide; MOVPE method; Chemical composition; III―V semiconductors; Nanostructured materials; Synchrotron radiation; Nanomaterial synthesis; Concentration gradient; III-V semiconductors; Crystal structure
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2013.02.112

In this work the structure of ternary GaxIn1−xP nanowires is investigated with respect to the chemical composition and homogeneity. The nanowires were grown by metal–organic vapor-phase epitaxy. For the investigation of ensemble fluctuations on several lateral length scales, X-ray diffraction reciprocal space maps have been analyzed. The data reveal a complicated varying materials composition across the sample and in the nanowires on the order of 20%. The use of modern synchrotron sources, where beam-sizes in the order of several 10μm are available, enables us to investigate compositional gradients along the sample by recording diffraction patterns at different positions. In addition, compositional variations were found also within single nanowires in X-ray energy dispersive spectroscopy measurements. •GaInP nanowires grown by metal organic vapor phase epitaxy•X-ray diffraction and X-ray energy dispersive spectroscopy investigations•Gradients of the chemical composition found in single nanowires and the ensemble