PtyNAMi: ptychographic nano‐analytical microscope

Ptychographic X‐ray imaging at the highest spatial resolution requires an optimal experimental environment, providing a high coherent flux, excellent mechanical stability and a low background in the measured data. This requires, for example, a stable performance of all optical components along the e...

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Published inJournal of applied crystallography Vol. 53; no. 4; pp. 957 - 971
Main Authors Schropp, Andreas, Döhrmann, Ralph, Botta, Stephan, Brückner, Dennis, Kahnt, Maik, Lyubomirskiy, Mikhail, Ossig, Christina, Scholz, Maria, Seyrich, Martin, Stuckelberger, Michael E., Wiljes, Patrik, Wittwer, Felix, Garrevoet, Jan, Falkenberg, Gerald, Fam, Yakub, Sheppard, Thomas L., Grunwaldt, Jan-Dierk, Schroer, Christian G.
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.08.2020
Blackwell Publishing Ltd
Subjects
Atom and Molecular Physics and Optics
Atom- och molekylfysik och optik
Environmental factors
Fysik
High temperature
in situ imaging
multi-modal imaging
Natural Sciences
Naturvetenskap
Optical components
Optics
Physical Sciences
ptychography
Spatial discrimination
Spatial resolution
Stability
tomography
Tracking systems
X-ray imaging
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Summary:Ptychographic X‐ray imaging at the highest spatial resolution requires an optimal experimental environment, providing a high coherent flux, excellent mechanical stability and a low background in the measured data. This requires, for example, a stable performance of all optical components along the entire beam path, high temperature stability, a robust sample and optics tracking system, and a scatter‐free environment. This contribution summarizes the efforts along these lines to transform the nanoprobe station on beamline P06 (PETRA III) into the ptychographic nano‐analytical microscope (PtyNAMi). The ptychographic nano‐analytical microscope (PtyNAMi) is designed for in situ/operando high‐resolution imaging in two and three dimensions with high sensitivity and structural, elemental, chemical and electronic contrast.
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ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S1600576720008420