电子束沉积TiAl合金的微观形貌及组织结构稳定性

利用大功率电子束物理气相沉积设备,采用单靶蒸镀方法制备厚度为0.3mm的自由态TiAl合金板,并对制备态样品进行不同温度（650-950℃）的真空退火处理。借助X射线衍射仪、扫描电子显微镜及透射电子显微镜分析退火处理对相组成及微观组织结构的影响。结果表明：Ti,Al元素饱和蒸气压的差异导致富Ti成分区和富Al成分区沿板材截面呈现交替变化,其组成相为α2-Ti3Al,γ-TiAl和τ-TiAl2;在650-950℃温度区间退火24h后,由于Al向Ti中扩散,呈现明显的界面融混和晶粒粗化,导致有序相含量的降低,其层状结构的退化受到孔洞形成、晶粒长大以及层间吞噬的影响。...

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Bibliographic Details
Published in材料工程 Vol. 44; no. 1; pp. 89 - 95
Main Author 马李 何录菊 邵先亦 王古平 张梦贤
Format Journal Article
LanguageChinese
Published 广东石油化工学院机电工程学院,广东茂名525000 2016
哈尔滨工业大学复合材料与结构研究所,哈尔滨150001%广东石油化工学院教育信息技术中心,广东茂名,525000%台州学院物理与电子工程学院,浙江台州,318000
Subjects
TiAl合金
微观形貌
电子束物理气相沉积
结构稳定性
饱和蒸气压
电子束物理气相沉积
TiAl合金
微观形貌
TiAl based alloy
saturated vapor pressure
饱和蒸气压
EB-PVD
structural stability
结构稳定性
micro-morphology
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Summary:利用大功率电子束物理气相沉积设备,采用单靶蒸镀方法制备厚度为0.3mm的自由态TiAl合金板,并对制备态样品进行不同温度（650-950℃）的真空退火处理。借助X射线衍射仪、扫描电子显微镜及透射电子显微镜分析退火处理对相组成及微观组织结构的影响。结果表明：Ti,Al元素饱和蒸气压的差异导致富Ti成分区和富Al成分区沿板材截面呈现交替变化,其组成相为α2-Ti3Al,γ-TiAl和τ-TiAl2;在650-950℃温度区间退火24h后,由于Al向Ti中扩散,呈现明显的界面融混和晶粒粗化,导致有序相含量的降低,其层状结构的退化受到孔洞形成、晶粒长大以及层间吞噬的影响。
Bibliography:MA Li,HE Lu-ju,SHAO Xian-yi,WANG Gu-ping,ZHANG Meng-xian （1. College of Mechanical and Electrical Engineering,Guangdong University of Petrochemical Technology, Maoming 525000,Guangdong,China; 2. Center for Composite Materials and Structures, Harbin Institute of Technology, Harbin 150001,China; 3. Education and Information Technology Center,Guangdong University of Petrochemical Technology, Maoming 525000, Guangdong, China; 4. College of Physical and Electronic Engineering, Taizhou University, Taizhou 318000, Zhejiang, China）
11-1800/TB
A free-standing TiAl based alloy thin sheet with thickness of 0.3mm was prepared by single source evaporation technology with high-power electron beam-physical vapour deposition（EB-PVD）system,and then the as-deposited samples were annealed in vacuum at 650-950℃.The effect of annealing on the microstructure and phase constitution of TiAl based alloy was studied with X-ray diffraction（XRD）,scanning electron microscope（SEM）and transmission electron microscope（TEM）.The results show th
ISSN:1001-4381
1001-4381
DOI:10.11868/j.issn.1001-4381.2016.01.014