高真空与脉冲放电气相色谱联用装置研发及其在岩石脱气化学分析中的应用
岩石中气体化学组成的分析具有重要意义.载气保护下的岩石脱气,过程比较复杂; 高真空下岩石脱 气的气相色谱分析报道较少,一般不能测量气体的总量;真空脱气质谱法对于分子量相近的气体,很难进行 测量.针对上述问题,本文研制了高真空岩石样品脱气分析装置,该装置真空度〈 10-4 Pa,空白样品压强 〈0.1 Pa,%含量测量精度为0.63%,标准温压下最少可测样品量〈1 mm3.将其与带脉冲放电检测器的气 相色谱仪联用,实现了岩石脱气及其微升量级气体化学组成的高灵敏气相色谱分析.利用本系统分析了五 大连池火山岩、松辽盆地储层岩石和四川盆地页岩样品中释放的气体,结果表明:相比以往的实验装置和方 法,该系...
Saved in:
Published in | 岩矿测试 Vol. 36; no. 3; pp. 222 - 230 |
---|---|
Main Author | |
Format | Journal Article |
Language | Chinese |
Published |
甘肃省油气资源研究重点实验室/中国科学院油气资源研究重点实验室,中国科学院地质与地球物理研究所,甘肃兰州730000%兰州大学地质科学与矿产资源学院,甘肃兰州,730000
2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | 岩石中气体化学组成的分析具有重要意义.载气保护下的岩石脱气,过程比较复杂; 高真空下岩石脱 气的气相色谱分析报道较少,一般不能测量气体的总量;真空脱气质谱法对于分子量相近的气体,很难进行 测量.针对上述问题,本文研制了高真空岩石样品脱气分析装置,该装置真空度〈 10-4 Pa,空白样品压强 〈0.1 Pa,%含量测量精度为0.63%,标准温压下最少可测样品量〈1 mm3.将其与带脉冲放电检测器的气 相色谱仪联用,实现了岩石脱气及其微升量级气体化学组成的高灵敏气相色谱分析.利用本系统分析了五 大连池火山岩、松辽盆地储层岩石和四川盆地页岩样品中释放的气体,结果表明:相比以往的实验装置和方 法,该系统能够直接测量岩石脱出气体的总量,分段加热脱气分析样品用量更少,气体组成分析灵敏度更高, 检测的主要成分是岩石脱气常见的成分,针对性较强. |
---|---|
Bibliography: | high vacuum electromagnetic crushing; micro liter gases; pulsed discharge shale gas LI Li-wu 1 , LIU Yan 1 , WANG Xian-bin 1 , ZHANG Ming- jie2, CAO Chun-hui 1 , XING Lan-tian 1 ,LI Zhong-ping 1(1 . Key Laboratory of Petroleum Resources, Gansu Province, Key Laboratory of Petroleum Resources Research, Institute of Geology and Geophysics, Chinese Academy of Sciences, Lanzhou 730000, China;2. School of Earth Sciences, Lanzhou University, Lanzhou 730000, China) 11-2131/TD It is important to determine the chemical composition of gases trapped in rocks. The technique of using carrier gas and chemical analysis to release and collect gases is very time- consuming. There is little reported about Gas Chromatography analysis of rock degassing under high vacuum, and the total amount of gases are not commonly measured. It is difficult to analyze gases with similar molecular weights by Mass Spectrometer and because of these problems, a high vacuum rock sample degassing device has been developed. The vacuum of the device is 〈 |
ISSN: | 0254-5357 |
DOI: | 10.15898/j.cnki.11-2131/td.201609080137 |