Mapping the performance of PV modules, effects of module type and data averaging

A method is presented for estimating the energy yield of photovoltaic (PV) modules at arbitrary locations in a large geographical area. The method applies a mathematical model for the energy performance of PV modules as a function of in-plane irradiance and module temperature and combines this with...

Full description

Saved in:
Bibliographic Details
Published inSolar energy Vol. 84; no. 2; pp. 324 - 338
Main Authors Huld, Thomas, Gottschalg, Ralph, Beyer, Hans Georg, Topič, Marko
Format Journal Article
LanguageEnglish
Published Kidlington Elsevier Ltd 01.02.2010
Elsevier
Pergamon Press Inc
Subjects
Online AccessGet full text
ISSN0038-092X
1471-1257
DOI10.1016/j.solener.2009.12.002

Cover

More Information
Summary:A method is presented for estimating the energy yield of photovoltaic (PV) modules at arbitrary locations in a large geographical area. The method applies a mathematical model for the energy performance of PV modules as a function of in-plane irradiance and module temperature and combines this with solar irradiation estimates from satellite data and ambient temperature values from ground station measurements. The method is applied to three different PV technologies: crystalline silicon, CuInSe 2 and CdTe based thin-film technology in order to map their performance in fixed installations across most of Europe and to identify and quantify regional performance factors. It is found that there is a clear technology dependence of the geographical variation in PV performance. It is also shown that using long-term average values of irradiance and temperature leads to a systematic positive bias in the results of up to 3%. It is suggested to use joint probability density functions of temperature and irradiance to overcome this bias.
Bibliography:SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 14
ObjectType-Article-2
content type line 23
ISSN:0038-092X
1471-1257
DOI:10.1016/j.solener.2009.12.002