Rapid response of the yield threshold and turgor regulation during adjustment of root growth to water stress in Zea mays

Responses of cortical cell turgor (P) following rapid changes in osmotic pressure were measured throughout the elongation zone of maize (Zea mays L.) roots using a cell pressure probe and compared with simultaneously measured root elongation to evaluate: yield threshold (Y) (minimum P for growth), w...

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Published inPlant physiology (Bethesda) Vol. 108; no. 1; pp. 303 - 312
Main Authors Jürgen Frensch, Hsiao, Theodore C.
Format Journal Article
LanguageEnglish
Published Rockville, MD American Society of Plant Physiologists 01.05.1995
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Summary:Responses of cortical cell turgor (P) following rapid changes in osmotic pressure were measured throughout the elongation zone of maize (Zea mays L.) roots using a cell pressure probe and compared with simultaneously measured root elongation to evaluate: yield threshold (Y) (minimum P for growth), wall extensibility, growth-zone radial hydraulic conductivity (K), and turgor recovery rate. Small increases in osmotic pressure (0.1 MPa) temporarily decreased P and growth, which recovered fully in 5 to 10 min. Under stronger osmotic pressure (up to 0.6 MPa), elongation stopped for up to 30 min and then resumed at lower rates. Recoveries in P through solute accumulation and lowering of Y enabled growth under water stress. P recovery was as much as 0.3 MPa at osmotic pressure = 0.6 MPa, but recovery rate declined as water stress increased, suggesting turgor-sensitive solute transport into the growth zone. Under strong osmotic pressure P did not recover in the basal part of the growth zone, in conjunction with a 30% shortening of the growth zone. Time courses showed Y beginning to decrease within several minutes after stress imposition, from about 0.65 MPa to a minimum of about 0.3 MPa in about 15 min. The data concerning Y were not confounded significantly by elastic shrinkage. K was high (1.3 X 10(-10) m2 s-1, MPa-1), suggesting very small growth-induced water potential gradients.
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ISSN:0032-0889
1532-2548
DOI:10.1104/pp.108.1.303