Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II

• Published in: Journal of synchrotron radiation Vol. 18; no. 6; pp. 862 - 870
• Main Authors: Honnicke, Marcelo G., Keister, Jeffrey W., Conley, Raymond, Kaznatcheev, Konstantine, Takacs, Peter Z., Coburn, David Scott, Reffi, Leo, Cai, Yong Q.
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.11.2011
• Subjects: EFFICIENCY; FOCUSING; GEOMETRY; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Kirkpatrick-Baez geometry; L-shaped mirror; LATTICE PARAMETERS; Metrology; MIRRORS; Montel optics; Multilayers; nested mirror; NSLS; OPTICS; PARTICLE ACCELERATORS; REFLECTIVITY; RESOLUTION; ROUGHNESS; SCATTERING; SPECTROMETERS; Synchrotron radiation; SYNCHROTRONS; TESTING; X-ray mirrors; X-ray optics; X-rays
• ISSN: 1600-5775; 0909-0495; 1600-5775
• DOI: 10.1107/S0909049511031098

Characterization and testing of an L‐shaped laterally graded multilayer mirror are presented. This mirror is designed as a two‐dimensional collimating optics for the analyzer system of the ultra‐high‐resolution inelastic X‐ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS‐II). The characterization includes point‐to‐point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X‐ray test of the mirror was carried out reversely as a focusing device. The results show that the L‐shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS‐II.