ICP-AES Determination of Trace Impurities in Copper by Using Ultrasonic Nebulization and Internal Standardization

• Published in: Analytical Sciences Vol. 9; no. 5; pp. 727 - 729
• Main Authors: FUKAYA, Tadahiro, TAKEYA, Minoru, SAYAMA, Yasumasa
• Format: Journal Article
• Language: English
• Published: Tokyo The Japan Society for Analytical Chemistry 1993; Japan Society for Analytical Chemistry; Japan Science and Technology Agency
• Subjects: Analytical chemistry; arsenic; bismuth; Chemistry; copper; coprecipitation; Exact sciences and technology; indium; inductively coupled plasma-atomic emission spectrometry; internal standardization; lead; selenium; Spectrometric and optical methods; tellurium; tin; Ultrasonic nebulization; Trace analysis; Emission spectrometry; Chemical analysis; Ultrasonic nebulization; Internal standard; Copper; Inductive coupling plasma spectrometry; Coprecipitation
• ISSN: 0910-6340; 1348-2246
• DOI: 10.2116/analsci.9.727

Although a sample introduction system in conjunction with ultrasonic nebulization (USN) for inductively coupled argon plasma-atomic emission spectroscopy (ICP-AES) has attracted attention, there have been only a few reports concerning the application of USN. The detection limits of ICP-AES with USN are reported to be at least one order lower than those obtained by ICP-AES combined with a pneumatic nebulizer, and are comparable to those obtained by graphite-furnace atomic absorption spectrometry (GF-AAS). However, it has been pointed out that the use of USN causes a poorer precision as well as a larger memory effect, especially when the concentration of the matrix is high. In order to overcome these disadvantages of USN, an internal standardization was used in the present study, and the developed method was applied to the determination of trace elements in copper samples. In order to reduce the memory effect due to the matrix, a coprecipitation method with indium (III) or lanthanum (III), which is often used in the GF-AAS method, is not suitable for trace analysis by ICP-AES measurements, because of an interference by their large number of emission lines. Thus, the established analytical procedure is suitable for the routine analysis of high-purity copper in industrial laboratories.