Flux Growth and Superconducting Properties of (Ce,Pr)OBiS2 Single Crystals
Ce 1− x Pr x OBiS 2 (0. 1 ≤ x ≤ 0.9) single crystals were grown using a CsCl flux method. Their structural and physical properties were examined by X-ray diffraction, X-ray absorption, transmission electron microscopy, and electrical resistivity. All of the Ce 1− x Pr x OBiS 2 single crystals with 0...
Saved in:
Published in | Frontiers in chemistry Vol. 8; p. 44 |
---|---|
Main Authors | , , , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Frontiers Media S.A
04.02.2020
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Ce
1−
x
Pr
x
OBiS
2
(0. 1 ≤
x
≤ 0.9) single crystals were grown using a CsCl flux method. Their structural and physical properties were examined by X-ray diffraction, X-ray absorption, transmission electron microscopy, and electrical resistivity. All of the Ce
1−
x
Pr
x
OBiS
2
single crystals with 0.1 ≤
x
≤ 0.9 exhibited tetragonal phase. With increasing Pr content, the
a
-axis and
c
-axis lattice parameters decreased and increased, respectively. Transmission electron microscope analysis of Ce
0.1
Pr
0.9
OBiS
2
(
x
= 0.9) single crystal showed no stacking faults. Atomic-resolution energy dispersive X-ray spectrometry mapping revealed that Bi, Ce/Pr, O, and S occupied different crystallographic sites, while Ce and Pr randomly occupied the same sites. X-ray absorption spectra showed that an increase of the Pr ratio increased the ratio of Ce
4+
/Ce
3+
. All of the Ce
1−
x
Pr
x
OBiS
2
crystals showed superconducting transition, with a maximum transition temperature of ~4 K at
x
= 0.9. |
---|---|
Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 Edited by: Evgeny V. Alekseev, Julich Research Centre, Germany This article was submitted to Inorganic Chemistry, a section of the journal Frontiers in Chemistry Reviewed by: Vladislav Klepov, University of South Carolina, United States; Tilo Söhnel, The University of Auckland, New Zealand |
ISSN: | 2296-2646 2296-2646 |
DOI: | 10.3389/fchem.2020.00044 |