Advanced atomic force microscopy techniques III

• Published in: Beilstein journal of nanotechnology Vol. 7; no. 1; pp. 1052 - 1054
• Main Authors: Glatzel, Thilo, Schimmel, Thomas
• Format: Journal Article
• Language: English
• Published: Germany Beilstein-Institut zur Föerderung der Chemischen Wissenschaften 2016; Beilstein-Institut
• Subjects: Atomic force microscopy; Cell adhesion & migration; Charged particles; Chemical reactions; Low temperature; Mechanical properties; Microscopes; Microscopy; Nanoscience; Nanotechnology; Spectrum analysis; Titanium alloys; atomic force microscopy
• ISSN: 2190-4286; 2190-4286
• DOI: 10.3762/bjnano.7.98

Chemical reactions are triggered and imaged by the AFM tip [16–17] and of course the technique is not limited to ultrahigh-vacuum (UHV) and low-temperature conditions. [...]the traditional field in surface science based on diffraction and scattering of charged particles, mostly electrons, which are used as probes in a variety of experimental methods is extended by a powerful local and real space imaging and characterization technique. [...]we want to thank all authors for contributing their excellent work to this series and especially the referees for their continuous support by providing sound and objective reports. Here, we also want to acknowledge the more and more important Open Access policy of the Beilstein Journal of Nanotechnology providing the possibility to continue this exciting and stimulating Thematic Series freely accessible worldwide. [...]we would like to thank the editing team of the Beilstein-Institut for the excellent and professional framework and support allowing for the collection, review, publishing, and distribution of research results in an easy and excellent way.