A method with ultra‐high angular resolution for X‐ray diffraction experiments
In X‐ray diffraction measurements, the angular resolution has a detection limit due to the receiving size of the detector. In many cases this detection limit is too large and must be breached to obtain the desired information. A novel method is proposed here by making the detector simultaneously mea...
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Published in | Journal of synchrotron radiation Vol. 31; no. 1; pp. 35 - 41 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
International Union of Crystallography
01.01.2024
John Wiley & Sons, Inc |
Subjects | |
Online Access | Get full text |
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Summary: | In X‐ray diffraction measurements, the angular resolution has a detection limit due to the receiving size of the detector. In many cases this detection limit is too large and must be breached to obtain the desired information. A novel method is proposed here by making the detector simultaneously measuring and moving. Using the deconvolution algorithm to remove the convolution effect, the pixel size limitation is finally broken. The algorithm used is not a common one, and suppresses signals at high frequencies, ensuring the reliability of the peak shape after restoration. The feasibility of this method is verified by successfully measuring the crystal truncation rod signal of SrTiO3 single crystal, and the resolution is nearly ten times higher than that of a single pixel. Moreover, this method greatly reduces the noise and improves the signal‐to‐noise ratio.
A method to acquire X‐ray scattered signals at high frequency while the detector is moving is proposed. The algorithm provided can break through the pixel size limitation, and the resolution is improved by almost ten times compared with that of a single pixel. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1600-5775 0909-0495 1600-5775 |
DOI: | 10.1107/S160057752300961X |