Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts

• Published in: Surface and interface analysis Vol. 45; no. 1; pp. 529 - 531
• Main Authors: Eller, M. J., Verkhoturov, S. V., Fernandez-Lima, F. A., DeBord, J. D., Schweikert, E. A., Della-Negra, S.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Chichester Blackwell Publishing Ltd 01.01.2013; Wiley; Wiley Subscription Services, Inc; Wiley-Blackwell
• Subjects: Analytical chemistry; Atomic, molecular, and ion beam impact and interactions with surfaces; Cluster SIMS; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electron and ion emission by liquids and solids; impact phenomena; Electron Emission; Electron Emission Microscope; Exact sciences and technology; Impact phenomena (including electron spectra and sputtering); Localization; Mass spectrometry; Nuclear Experiment; Physics; Secondary electron; Transition elements; Fullerenes; SIMS; Silicon; Cluster SIMS; Electron Emission Microscope; Secondary emission; Electron emission; Copper; Molecular ions; Localization; Electron Emission
• ISSN: 0142-2421; 1096-9918
• DOI: 10.1002/sia.4949

The use of large cluster primary ions (e.g. C60, Au400) in secondary ion mass spectrometry has become prevalent in recent years due to their enhanced emission of secondary ions, in particular, molecular ions (MW ≤ 1500 Da). The co‐emission of electrons with SIs was investigated per projectile impact. It has been found that SI and electrons yields increased with increasing projectile energy and size. The use of the emitted electrons from impacts of C60 for localization has been demonstrated for cholesterol deposited on a copper grid. The instrumentation, methodologies, and results from these experiments are presented. Copyright © 2012 John Wiley & Sons, Ltd.