Light-Induced Ambient Degradation of Few-Layer Black Phosphorus: Mechanism and Protection

The environmental instability of single‐ or few‐layer black phosphorus (BP) has become a major hurdle for BP‐based devices. The degradation mechanism remains unclear and finding ways to protect BP from degradation is still highly challenging. Based on ab initio electronic structure calculations and...

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Published inAngewandte Chemie International Edition Vol. 55; no. 38; pp. 11437 - 11441
Main Authors Zhou, Qionghua, Chen, Qian, Tong, Yilong, Wang, Jinlan
Format Journal Article
LanguageEnglish
Published Germany Blackwell Publishing Ltd 12.09.2016
Wiley Subscription Services, Inc
EditionInternational ed. in English
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Summary:The environmental instability of single‐ or few‐layer black phosphorus (BP) has become a major hurdle for BP‐based devices. The degradation mechanism remains unclear and finding ways to protect BP from degradation is still highly challenging. Based on ab initio electronic structure calculations and molecular dynamics simulations, a three‐step picture on the ambient degradation of BP is provided: generation of superoxide under light, dissociation of the superoxide, and eventual breakdown under the action of water. The well‐matched band gap and band‐edge positions for the redox potential accelerates the degradation of thinner BP. Furthermore, it was found that the formation of P‐O‐P bonds can greatly stabilize the BP framework. A possible protection strategy using a fully oxidized BP layer as the native capping is thus proposed. Such a fully oxidization layer can resist corrosion from water and leave the BP underneath intact with simultaneous high hole mobility. Protected by native oxide: A three‐step picture of the ambient degradation of black phosphorus (BP) is given. A possible protection strategy using a fully oxidized BP layer as the capping is proposed. Such a fully oxidized layer can resist corrosion from water and leave the BP underneath intact with simultaneous high hole mobility.
Bibliography:NSF of Jiangsu - No. BK20130016
SRFDP - No. 20130092110029; No. 20130092120042
ArticleID:ANIE201605168
NSFC - No. 21525311; No. 21373045; No. 11404056
istex:B01C94F9CCFC69919D847F918783200B4B6CD9ED
Central Universities of China
ark:/67375/WNG-10ZGMQM3-N
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
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ISSN:1433-7851
1521-3773
1521-3773
DOI:10.1002/anie.201605168