A new method for evaluating the size of plate-like precipitates by small-angle scattering
A methodology is presented for extracting the thickness and length of plate‐like precipitates from streaking that appears in the small‐angle scattering pattern of moderately textured polycrystalline samples. This methodology builds upon existing work on single crystals but is extended to polycrystal...
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Published in | Journal of applied crystallography Vol. 45; no. 6; pp. 1208 - 1218 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
International Union of Crystallography
01.12.2012
Blackwell Publishing Ltd |
Subjects | |
Online Access | Get full text |
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Summary: | A methodology is presented for extracting the thickness and length of plate‐like precipitates from streaking that appears in the small‐angle scattering pattern of moderately textured polycrystalline samples. This methodology builds upon existing work on single crystals but is extended to polycrystals through a modeling of the streaking misalignment distribution. It is also shown that it is essential to take into account the Ewald sphere curvature. The protocol is applied to an in situ small‐angle X‐ray scattering study of the transition between θ′ and T1 in an Al–Li–Cu system, where the contributions of both phases are well separated, and the size, volume fraction and number density are monitored. |
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Bibliography: | istex:F068DB6E6DD3194C5FEB53AC28FB49AF020A03EB ark:/67375/WNG-Q0F6J4P0-L ArticleID:JCRAJ5199 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S0021889812039891 |