Thermal conductivity measurements via time-domain thermoreflectance for the characterization of radiation induced damage

• Published in: Journal of materials research Vol. 30; no. 9; pp. 1403 - 1412
• Main Authors: Cheaito, Ramez, Gorham, Caroline S., Misra, Amit, Hattar, Khalid, Hopkins, Patrick E.
• Format: Journal Article
• Language: English
• Published: New York, USA Cambridge University Press 14.05.2015; Springer International Publishing; Springer Nature B.V; Materials Research Society
• Subjects: Accumulation; Analysis; Applied and Technical Physics; Biomaterials; Conductivity; Damage; Editors; Electron microscopes; Energy (nuclear); GENERAL STUDIES OF NUCLEAR REACTORS; Heat conductivity; Heat transfer; Inorganic Chemistry; Lasers; Materials Engineering; Materials research; MATERIALS SCIENCE; Measurement techniques; Microscopy; Multilayers; Nanostructure; Nanostructured materials; Nanotechnology; Nuclear fission; Nuclear fuels; Nuclear reactor components; Nuclear reactors; Point defects; Radiation; Silicon; Studies; Thermal conductivity; Thermal measurements
• ISSN: 0884-2914; 2044-5326
• DOI: 10.1557/jmr.2015.11

The progressive build up of fission products inside different nuclear reactor components can lead to significant damage of the constituent materials. We demonstrate the use of time-domain thermoreflectance (TDTR), a nondestructive thermal measurement technique, to study the effects of radiation damage on material properties. We use TDTR to report on the thermal conductivity of optimized ZIRLO, a material used as fuel cladding in nuclear reactors. We find that the thermal conductivity of optimized ZIRLO is 10.7 ± 1.8 W m−1 K−1 at room temperature. Furthermore, we find that the thermal conductivities of copper–niobium nanostructured multilayers do not change with helium ion irradiation doses of 1015 cm−2 and ion energy of 200 keV, demonstrating the potential of heterogeneous multilayer materials for radiation tolerant coatings. Finally, we compare the effect of ion doses and ion beam energies on the measured thermal conductivity of bulk silicon. Our results demonstrate that TDTR can be used to quantify depth dependent damage.