Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain pro...

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Published inStructural dynamics (Melville, N.Y.) Vol. 1; no. 6; p. 064501
Main Authors Schick, Daniel, Herzog, Marc, Bojahr, André, Leitenberger, Wolfram, Hertwig, Andreas, Shayduk, Roman, Bargheer, Matias
Format Journal Article
LanguageEnglish
Published United States American Institute of Physics, Inc 01.11.2014
American Crystallographic Association
AIP Publishing LLC and ACA
Subjects
Acoustic impedance
Acoustic propagation
Film thickness
Impedance matching
Strain analysis
Stress propagation
Substrates
Thin films
X-ray diffraction
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Summary:Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates.
Bibliography:ObjectType-Article-1
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Electronic mail: bargheer@uni-potsdam.de; URL: http://www.udkm.physik.uni-potsdam.de.
ISSN:2329-7778
2329-7778
DOI:10.1063/1.4901228