Measurement of Pressure Distribution in EHL-Development of Method and Application to Dry Static Contacts

• Published in: Tribology transactions Vol. 48; no. 4; pp. 474 - 483
• Main Authors: CANN, P. M., SPIKES, H. A.
• Format: Journal Article
• Language: English
• Published: Colchester Taylor & Francis Group 01.10.2005; Taylor & Francis; Taylor & Francis Inc
• Subjects: Applied sciences; Contact Mechanics; Elastohydrodynamic Lubrication (EHL); Exact sciences and technology; Friction, wear, lubrication; Fundamental areas of phenomenology (including applications); Lubricants & lubrication; Machine components; Mechanical contact (friction...); Mechanical engineering. Machine design; Mechanics; Physics; Pressure; Solid mechanics; Structural and continuum mechanics; Surface roughness; Surface Roughness Effects; Tribology; Interfacial layer; Optical interferometry; Transient response; Surface Roughness Effects; Texturation; Static contact; Pressure distribution; Mechanical contact; Rough surface; Layer thickness; Elastohydrodynamic Lubrication (EHL); Thin film; Elastic layer; Dry friction; Static conditions; Contact Mechanics; Pressure measurement; Smooth surface; Elastohydrodynamic lubrication; Tribology
• ISSN: 1040-2004; 1547-397X
• DOI: 10.1080/05698190500313460

The development and application of a new technique to measure the pressure distribution in an elastohydrodynamic contact is described. The method uses optical interferometry to measure the local compression of a thin elastic layer sandwiched between the loaded surfaces. The elastic-layer thickness is mapped as a line profile across the contact and the measured compression is calibrated to give a pressure distribution. The data are acquired through a single triggered image rather than a scanning system so that transient pressures can be measured. The current study is limited to static contacts, and pressure profiles are presented for a number of contact conditions. These include smooth and textured surfaces and entrained debris. The results are compared to theoretical predictions for smooth surfaces. Presented at the STLE Annual Meeting in Toronto, Ontario, Canada May 17-2, 2004 Review led by Bob Errichello