Photoelectron angular distributions as sensitive probes of surfactant layer structure at the liquid-vapor interface

The characterization of liquid-vapor interfaces at the molecular level is an important underpinning for a basic understanding of fundamental heterogeneous processes in many areas, such as atmospheric science. Here we use X-ray photoelectron spectroscopy to study the adsorption of a model surfactant,...

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Published inPhysical chemistry chemical physics : PCCP Vol. 24; no. 8; pp. 4796 - 488
Main Authors Dupuy, Rémi, Filser, Jakob, Richter, Clemens, Seidel, Robert, Trinter, Florian, Buttersack, Tillmann, Nicolas, Christophe, Bozek, John, Hergenhahn, Uwe, Oberhofer, Harald, Winter, Bernd, Reuter, Karsten, Bluhm, Hendrik
Format Journal Article
LanguageEnglish
Published England Royal Society of Chemistry 23.02.2022
The Royal Society of Chemistry
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Summary:The characterization of liquid-vapor interfaces at the molecular level is an important underpinning for a basic understanding of fundamental heterogeneous processes in many areas, such as atmospheric science. Here we use X-ray photoelectron spectroscopy to study the adsorption of a model surfactant, octanoic acid, at the water-gas interface. In particular, we examine the information contained in photoelectron angular distributions and show that information about the relative depth of molecules and functional groups within molecules can be obtained from these measurements. Focusing on the relative location of carboxylate (COO − ) and carboxylic acid (COOH) groups at different solution pH, the former is found to be immersed deeper into the liquid-vapor interface, which is confirmed by classical molecular dynamics simulations. These results help establish photoelectron angular distributions as a sensitive tool for the characterization of molecules at the liquid-vapor interface. Photoelectron angular distributions can yield information on the relative depth of different molecular groups at the liquid-vapor interface.
Bibliography:10.1039/d1cp05621b
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These authors contributed equally to this work.
ISSN:1463-9076
1463-9084
1463-9084
DOI:10.1039/d1cp05621b