Two-terminal metal-inter-connected multijunction III-V solar cells

A novel bonding approach with an interface consisting of a metal and dielectric is developed, and a “pillar‐array” metal topology is proposed for minimal optical and electrical loss at the interface. This enables a fully lattice‐matched two‐terminal, four‐junction device that consists of an inverted...

Full description

Saved in:
Bibliographic Details
Published inProgress in photovoltaics Vol. 23; no. 5; pp. 593 - 599
Main Authors Lin, Chieh-Ting, McMahon, William E., Ward, James S., Geisz, John F., Wanlass, Mark W., Carapella, Jeffrey J., Olavarria, Waldo, Perl, Emmett E., Young, Michelle, Steiner, Myles A., France, Ryan M., Kibbler, Alan E., Duda, Anna, Moriarty, Tom E., Friedman, Daniel J., Bowers, John E.
Format Journal Article
LanguageEnglish
Published Bognor Regis Blackwell Publishing Ltd 01.05.2015
Wiley Subscription Services, Inc
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A novel bonding approach with an interface consisting of a metal and dielectric is developed, and a “pillar‐array” metal topology is proposed for minimal optical and electrical loss at the interface. This enables a fully lattice‐matched two‐terminal, four‐junction device that consists of an inverted top two‐junction (2J) cell with 1.85 eV GaInP/1.42 eV GaAs, and an upright lower 2J cell with ~1 eV GaInAsP/0.74 eV GaInAs aimed for concentrator applications. The fabrication process and simulation of the metal topology are discussed along with the results of GaAs/GaInAs 2J and (GaInP + GaAs)/GaInAs three‐junction bonded cells. Bonding‐related issues are also addressed along with optical coupling across the bonding interface. Copyright © 2014 John Wiley & Sons, Ltd. A novel bonding method for multijunction photovoltaic devices that allows integration of dissimilar material is presented and demonstrated. The bonding interface utilizes a metal and dielectric with “pillar‐array” topology to minimize optical and electrical loss. Process‐related damage were addressed along with results of various bonded devices including a bonded triple‐junction device with Voc = 2.70 V, Jsc = 12.66 mA/cm2, fill factor = 83.0%, and efficiency = 28.39% under the 1‐sun American Society for Testing and Materials (ASTM) G173 direct spectrum.
Bibliography:US Department of Energy, Office of Science, and Office of Basic Energy Sciences - No. DE-SC0001009
National Science Foundation Graduate Research Fellowship - No. DGE-1144085
ark:/67375/WNG-CFF056VG-C
ArticleID:PIP2468
istex:74F4CB799876C91C33A3B6AE0B110ED544DFEADA
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1062-7995
1099-159X
DOI:10.1002/pip.2468