Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

AFM of cocrystals: Atomic force microscopy can be used to observe phase changes at crystal surfaces where the transformation is accompanied by a change in the spacing between layers of molecules (see picture). The conversion of a metastable polymorph of the caffeine–glutaric acid cocrystal into the...

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Published inAngewandte Chemie International Edition Vol. 52; no. 40; pp. 10541 - 10544
Main Authors Thakuria, Ranjit, Eddleston, Mark D., Chow, Ernest H. H., Lloyd, Gareth O., Aldous, Barry J., Krzyzaniak, Joseph F., Bond, Andrew D., Jones, William
Format Journal Article
LanguageEnglish
Published Weinheim WILEY-VCH Verlag 27.09.2013
WILEY‐VCH Verlag
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Summary:AFM of cocrystals: Atomic force microscopy can be used to observe phase changes at crystal surfaces where the transformation is accompanied by a change in the spacing between layers of molecules (see picture). The conversion of a metastable polymorph of the caffeine–glutaric acid cocrystal into the thermodynamically stable form was analyzed continuously in situ using intermittent‐contact‐mode atomic force microscopy.
Bibliography:R.T. and E.H.H.C. are grateful to the Pfizer Institute for Pharmaceutical Materials Science, G.O.L. to the Herchel Smith Fund and M.D.E. to the EU INTERREG IVA 2 Mers Seas Zeeën Cross-border Cooperation Programme for financial support. D. R. M. Vatvani is thanked for help with morphology predictions, M. Arhangelskis for help with Rietveld refinement of the powder X-ray data.
ArticleID:ANIE201302532
ark:/67375/WNG-46L2HB0Z-R
Herchel Smith Fund
istex:8E1DFB86A967C319F565A3527F32056F26736B9A
EU INTERREG IVA 2 Mers Seas Zeeën Cross-border Cooperation Programme
R.T. and E.H.H.C. are grateful to the Pfizer Institute for Pharmaceutical Materials Science, G.O.L. to the Herchel Smith Fund and M.D.E. to the EU INTERREG IVA 2 Mers Seas Zeeën Cross‐border Cooperation Programme for financial support. D. R. M. Vatvani is thanked for help with morphology predictions, M. Arhangelskis for help with Rietveld refinement of the powder X‐ray data.
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1433-7851
1521-3773
DOI:10.1002/anie.201302532