A method and device for measuring the capacitance and Q-factor of microwave varactors and variconds

A method and device for measuring the bias-voltage dependences of the Q-factor and capacitance for variconds and varactors of different dimensions and structures (two-electrode and three-electrode structures) in the 1–10 GHz frequency band are considered. By placing the devices to be measured outsid...

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Bibliographic Details
Published inMeasurement techniques Vol. 55; no. 7; pp. 834 - 838
Main Authors Kozyrev, A. B., Kosmin, D. M., Kotelnikov, I. V., Mikhailov, A. K., Osadchy, V. N.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.10.2012
Springer
Springer Nature B.V
Subjects
Accuracy
Analysis
Analytical Chemistry
Automation
Calibration
Capacitance
Certification
Characterization and Evaluation of Materials
Devices
Electrodes
Electrons
Frequency bands
Holes
Measurement Science and Instrumentation
Measurement techniques
Measuring instruments
Microwaves
Physical Chemistry
Physics
Physics and Astronomy
Questions and answers
Studies
Varactors
Q-factor
microwave measurements
varicond
capacitance
varactor
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Summary:A method and device for measuring the bias-voltage dependences of the Q-factor and capacitance for variconds and varactors of different dimensions and structures (two-electrode and three-electrode structures) in the 1–10 GHz frequency band are considered. By placing the devices to be measured outside a closed resonant cavity in a special microstrip holder, the measuring instrument can easily be adapted for rapid automated certification of the components and their mass production.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0543-1972
1573-8906
DOI:10.1007/s11018-012-0047-3