Reliability and validity of the korean version of the connor-davidson resilience scale

The Connor-Davidson Resilience Scale (CD-RISC) measures various aspects of psychological resilience in patients with posttraumatic stress disorder (PTSD) and other psychiatric ailments. This study sought to assess the reliability and validity of the Korean version of the Connor-Davidson Resilience S...

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Published inPsychiatry investigation Vol. 7; no. 2; pp. 109 - 115
Main Authors Baek, Hyun-Sook, Lee, Kyoung-Uk, Joo, Eun-Jeong, Lee, Mi-Young, Choi, Kyeong-Sook
Format Journal Article
LanguageEnglish
Published Korea (South) Korean Neuropsychiatric Association 01.06.2010
대한신경정신의학회
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Summary:The Connor-Davidson Resilience Scale (CD-RISC) measures various aspects of psychological resilience in patients with posttraumatic stress disorder (PTSD) and other psychiatric ailments. This study sought to assess the reliability and validity of the Korean version of the Connor-Davidson Resilience Scale (K-CD-RISC). In total, 576 participants were enrolled (497 females and 79 males), including hospital nurses, university students, and firefighters. Subjects were evaluated using the K-CD-RISC, the Beck Depression Inventory (BDI), the Impact of Event Scale-Revised (IES-R), the Rosenberg Self-Esteem Scale (RSES), and the Perceived Stress Scale (PSS). Test-retest reliability and internal consistency were examined as a measure of reliability, and convergent validity and factor analysis were also performed to evaluate validity. Cronbach's alpha coefficient and test-retest reliability were 0.93 and 0.93, respectively. The total score on the K-CD-RISC was positively correlated with the RSES (r=0.56, p<0.01). Conversely, BDI (r=-0.46, p<0.01), PSS (r=-0.32, p<0.01), and IES-R scores (r=-0.26, p<0.01) were negatively correlated with the K-CD-RISC. The K-CD-RISC showed a five-factor structure that explained 57.2% of the variance. The K-CD-RISC showed good reliability and validity for measurement of resilience among Korean subjects.
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content type line 23
G704-002181.2010.7.2.002
ISSN:1738-3684
1976-3026
DOI:10.4306/pi.2010.7.2.109