Microstructural Evaluation of Bi-Ag and Bi-Sb Lead-Free High-Temperature Solder Candidates on Copper Substrate with Multiple Reflow Number

An impetus has been provided towards the development of lead-free solders by worldwide environmental legislation that banned the use of lead in solders due to the lead toxicity.This study focus on Bi-Ag and Bi-Sb solder alloys, in compositions from 1.5 to 5 wt % Ag and Sb. The effects of Ag and Sb a...

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Published inApplied Mechanics and Materials Vol. 564; no. Advances in Mechanical and Manufacturing Engineering; pp. 388 - 393
Main Authors Nahavandi, Mahdi, Mohamed Ariff, Azmah Hanim, Baserfalak, F., Ismarrubie, Z.N.
Format Journal Article
LanguageEnglish
Published Zurich Trans Tech Publications Ltd 01.06.2014
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Summary:An impetus has been provided towards the development of lead-free solders by worldwide environmental legislation that banned the use of lead in solders due to the lead toxicity.This study focus on Bi-Ag and Bi-Sb solder alloys, in compositions from 1.5 to 5 wt % Ag and Sb. The effects of Ag and Sb amount, and reflow number on the microstructure and morphology of solder bulk were analysed by optical microscope and scanning electron microscope-energy dispersive X-ray. Based on the results, the grain boundary grooving was observed in all samples except Bi-5Sb in all three reflows. Metallurgical and chemical reaction between interface and solders were found in Bi-5Sb solder alloys in different reflow numbers which lead to appearance of Cu3Sb intermetallic compound layer at the interface. Reflow numbers had a significant effect on the size of Cu-rich phase. Also it was observed that, with increasing reflow number Bi-Cu phase found in Bi-2.5Sb solder dissolves into the solder bulk.
Bibliography:Selected, peer reviewed papers from the International Conference on Advances in Mechanical and Manufacturing Engineering (ICAM2E 2013), November 25-28, 2013, Kuala Lumpur, Malaysia
ObjectType-Article-1
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ISBN:9783038351085
3038351083
ISSN:1660-9336
1662-7482
1662-7482
DOI:10.4028/www.scientific.net/AMM.564.388