Microstructural Evaluation of Bi-Ag and Bi-Sb Lead-Free High-Temperature Solder Candidates on Copper Substrate with Multiple Reflow Number
An impetus has been provided towards the development of lead-free solders by worldwide environmental legislation that banned the use of lead in solders due to the lead toxicity.This study focus on Bi-Ag and Bi-Sb solder alloys, in compositions from 1.5 to 5 wt % Ag and Sb. The effects of Ag and Sb a...
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Published in | Applied Mechanics and Materials Vol. 564; no. Advances in Mechanical and Manufacturing Engineering; pp. 388 - 393 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Zurich
Trans Tech Publications Ltd
01.06.2014
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Subjects | |
Online Access | Get full text |
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Summary: | An impetus has been provided towards the development of lead-free solders by worldwide environmental legislation that banned the use of lead in solders due to the lead toxicity.This study focus on Bi-Ag and Bi-Sb solder alloys, in compositions from 1.5 to 5 wt % Ag and Sb. The effects of Ag and Sb amount, and reflow number on the microstructure and morphology of solder bulk were analysed by optical microscope and scanning electron microscope-energy dispersive X-ray. Based on the results, the grain boundary grooving was observed in all samples except Bi-5Sb in all three reflows. Metallurgical and chemical reaction between interface and solders were found in Bi-5Sb solder alloys in different reflow numbers which lead to appearance of Cu3Sb intermetallic compound layer at the interface. Reflow numbers had a significant effect on the size of Cu-rich phase. Also it was observed that, with increasing reflow number Bi-Cu phase found in Bi-2.5Sb solder dissolves into the solder bulk. |
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Bibliography: | Selected, peer reviewed papers from the International Conference on Advances in Mechanical and Manufacturing Engineering (ICAM2E 2013), November 25-28, 2013, Kuala Lumpur, Malaysia ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISBN: | 9783038351085 3038351083 |
ISSN: | 1660-9336 1662-7482 1662-7482 |
DOI: | 10.4028/www.scientific.net/AMM.564.388 |