A Biaxial Strain Sensor Using a Single MoS2 Grating

In this paper, we report a new type of MoS 2 -based grating sensor for in-plane biaxial strain gauges with a precision limit of ~ 1‰. The MoS 2 grating is numerically simulated with different biaxial strains up to 5%. Our first-principles calculations reveal that the strain sensitivity of the MoS 2...

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Published inNanoscale research letters Vol. 16; no. 1; p. 31
Main Authors Xiang, Junxiang, Wang, Wenhui, Feng, Lantian, Feng, Chao, Huang, Meng, Liu, Ping, Ren, XiFeng, Xiang, Bin
Format Journal Article
LanguageEnglish
Published New York Springer US 10.02.2021
Springer Nature B.V
SpringerOpen
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Summary:In this paper, we report a new type of MoS 2 -based grating sensor for in-plane biaxial strain gauges with a precision limit of ~ 1‰. The MoS 2 grating is numerically simulated with different biaxial strains up to 5%. Our first-principles calculations reveal that the strain sensitivity of the MoS 2 reflectance spectrum can be considered an additional strain sensor integrated with the grating structure, enabling the mapping of in-plane biaxial strains. Our experimental studies on a prototype MoS 2 -grating sensor further confirm that a strain component perpendicular to the grating period can cause intensity peak shifts in the grating’s first-order diffraction patterns. This work opens a new path towards the sensing of in-plane biaxial strain within a single-grating device. Our new approach is applicable for other materials that have predictable reflectance response under biaxial strains and the capacity to form a two-dimensional single-crystal layer.
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ISSN:1556-276X
1931-7573
1556-276X
DOI:10.1186/s11671-021-03493-3